Intel Corporation

Pacific Biosciences of California, Inc.

Bidhan P Chaudhuri

Stephen Wilson Turner

Jonas Korlach

Achintya K Bhowmik

Anders Grunnet-Jepsen

Keith P Bjornson

Robin A Emig

William Robert Hanson

Mathieu Foquet

Ravi Saxena

Jon M Sorenson

Adrian Nielsen Fehr

Benjamin A Flusberg

John Dixon

Michael P Skinner

Mahesh R Junnarkar

Paul M Newby

Hans Callebaut

Gabel Chong

Robert Sebra

Chan H Yoo

Mahmood Toofan

Sundeep Raniwala

A method and apparatus for performing inbuilt calibration of camera system that performs three-dimensional measurements and depth reconstruction are described. In one embodiment, the method includes displaying, using a projector of a capture device, a fiducial projection pattern in response to calibration of the capture device. The method may also include capturing, with a camera of the capture, an image of the fiducial projection pattern. The method may also include determining calibration coefficient values indicative of relative physical relationships of one or more components of the depth camera system based on analysis of the captured image of the fiducial projection pattern.

System and method for calibration of a depth camera system

The invention relates to devices and methods for nanopore sequencing. The invention includes arrays of nanopores having incorporated electronic circuits, for example, in CMOS. In some cases, the arrays of nanopores comprise resistive openings for isolating the electronic signals for improved sequencing. Methods for controlling translocation of through the nanopore are disclosed.

Nanopore sequencing devices and methods

The invention provides environmental packages, instruments, and methods for sealing, protecting, and providing analysis chips for processing and analysis. The analysis chips are bonded directly or indirectly to chip carriers which are held within the chambers of an environmental packaging strip. The chambers are sealed with a sealing film such that the chip carriers can be extracted using a piercing tool and an extraction tool.

Sealed chip package

A waveguide under test can be exposed to a light signal whose polarization rotates between the vertical and horizontal polarizations. The intensity detected at a photodetector can be separated into AC and DC components. The AC components may be utilized to derive a characteristics which is indicative of birefringence of the waveguide. If the light signal is scanned over the waveguide under test, a measure of the birefringence at each position along the waveguide may be determined.

Birefringence profiler

Optical waveguides with power monitoring or optical detection capabilities are disclosed. The waveguide includes a lower cladding, a core disposed on the lower cladding, an upper cladding disposed on the core and a trench extending transversely through a distal end of the lower cladding, core and upper cladding. The trench includes a distal wall that provides a reflective surface disposed at an angle relative to the end of the core of greater than 90&#xb0;. A detector is disposed above the trench for receiving a reflected light beam off of the reflective surface. Various methods of manufacturing these devices are also disclosed.

Waveguides with optical monitoring

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Santa Clara, CA, United States of America

Bidhan P Chaudhuri