Nuctech Company Limited

Tsinghua University

Other

Bicheng Liu

Guangming Xu

Jianping Gu

Ziran Zhao

Lan Zhang

Zhiqiang Chen

Jun Li

Bo Li

Haifan Hu

Xuepeng Cao

Yingshuai Du

Zonggui Wu

Shangmin Sun

Yu Hu

Yuanjing Li

Kejun Kang

Jianmin Li

Qi Wang

Hao Yu

Xuewu Wang

Junli Li

Chunguang Zong

Weizhen Wang

Zhi Zeng

Qian Yi

Li Ni Zhang

Yaohong Liu

Yongqiang Wang

Jianping Cheng

Xi Yi

Qiang Li

Hui Zhang

Liang Li

Qingjun Zhang

Juan Zheng

Yuxiang Xing

Li Zhang

Huaping Tang

Weifeng Yu

Yanwei Xu

Dongyu Wang

Yuan Ma

Haoran Zhang

Song Liang

Yongming Wang

Ming Zeng

Hao Ma

Haojie Chi

Tiao Zhao

Junjie Tu

Yuan Wo

Xingyu Pan

Qiangqiang Zhu

Jungli Li

The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.

Backscatter imaging device, control method and inspection system

The present disclosure provides a method and device for correcting a scanned image, and an image scanning system, and relates to the field of image scanning. The method includes obtaining a scanned image of a scanned object, detecting one or more reference objects from the scanned image, determining a deformation parameter of each reference object of the one or more reference objects based on preset a standard parameter of the each reference object, and correcting the scanned image based on the deformation parameters of the one or more reference objects.

Method and device for correcting a scanned image and image scanning system

A method, a device and a security system for image data processing based on VR or AR are disclosed. In one aspect, an example image data processing method includes reconstructing, based on three-dimensional (3D) scanned data of a containing apparatus in which objects are contained, a 3D image of the containing apparatus and the objects contained in the containing apparatus. The reconstructed 3D image is stereoscopically displayed. Manipulation information is determined for at least one of the objects in the containing apparatus based on positioning information and action information of a user. At least a 3D image of the at least one object is reconstructed based on the determined manipulation information. The at least one reconstructed object is presented on the displayed 3D image.

Image data processing method, device and security inspection system based on VR or AR

The present disclosure provides a substance identification device and a substance identification method. The substance identification device comprises: a classifier establishing unit configured to establish a classifier based on scattering density values reconstructed for a plurality of known sample materials, wherein the classifier comprises a plurality of feature regions corresponding to a plurality of characteristic parameters for the plurality of known sample materials, respectively; and an identification unit for a material to be tested, configured to match the characteristic parameter of the material to be tested with the classifier, and to identify a type of the material to be tested by obtaining a feature region corresponding to the characteristic parameter of the material to be tested.

Substance identification device and method for extracting statistical feature based on cluster analysis

The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.

Back scattering inspection system and back scattering inspection method

The present disclosure provides a spiral Computed Tomography (CT) device and a three-dimensional image reconstruction method. The spiral CT device includes: an inspection station operable to carry an object to be inspected and defining an inspection space; a rotational supporting apparatus disposed around the inspection space; a plurality of X-ray sources located on the rotational supporting apparatus; and a plurality of X-ray receiving apparatuses located on the rotational supporting apparatus and opposing to the plurality of X-ray sources respectively, wherein the plurality of X-ray sources and the plurality of X-ray receiving apparatuses are rotational synchronously with the rotational supporting apparatus, wherein the plurality of X-ray sources are closely disposed and fan-shaped X-ray beams provided by the plurality of X-ray sources cover the inspection space with a minimum degree of overlapping.

Spiral CT device and Three-dimensional image reconstruction method

The present disclosure discloses a method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and identifying the item to be inspected as the item corresponding to the minimum distance. The present disclosure is based on a multi-energy-spectrum X-ray imaging system, and proposes a method of substance identification by analyzing the multi-energy-spectrum substance identification issue. Compared with the conventional dual-energy X-ray system, the multi-spectrum imaging can significantly improve the system's ability to identify substances in theory, especially in the field of security applications. The improvement of substance identification is important for contraband inspection, such as, drugs, explosives.

Multi-energy-spectrum X-ray imaging system and method of substance identification of item to be inspected by using the same

The present disclosure discloses a method, apparatus and system for assisting security inspection, and relates to the field of security inspection. The method includes: acquiring registration information of an inspected object; acquiring a standard scanned image corresponding to the registration information; displaying the standard scanned image in an AR manner to determine whether the inspected object is a suspicious object through comparing the standard scanned image with an actual scanned image, the actual scanned image comprising an image of the inspected object.

Security inspection based on scanned images

The present disclosure provides an image processing method, device, and computer readable storage medium, relating to the field of image processing technology, the method includes: acquiring a first undersampled image to be processed; and reconstructing, according to a mapping relationship between an undersampled image and a normally sampled original image, the first undersampled image to a corresponding first original image, wherein the mapping relationship is obtained by training a machine learning model with a second undersampled image and a normally sampled second original image corresponding to the second undersampled image as training samples.

Image processing method, device, and computer readable storage medium

A semiconductor detector and a packaging method thereof. The semiconductor detector includes: a cathode circuit board including a read out chip, a high voltage side top layer of the cathode circuit board, a bottom connection layer of the cathode circuit board and a dielectric filled between the high voltage side top layer and the bottom connection layer, wherein the high voltage side top layer is connected to the bottom connection layer through a via hole; and a detector crystal including a crystal body, an anode and a cathode, the anode is connected to the read out chip of the cathode circuit board, the high voltage side top layer is connected to an input terminal of the semiconductor detector and the bottom connection layer directly contacts the cathode of the detector crystal to connect the cathode to the cathode circuit board.

Semiconductor detector and method for packaging the same

The present disclosure provides an apparatus for processing signals for a plurality of energy regions, and a system and method for detecting radiation of a plurality of energy regions. The apparatus for processing signals for a plurality of energy regions may comprise: a first processor, configured to receive a signal from a detector and process the received signal to generate a gated signal, wherein a turn-on period of the gated signal represents magnitude of the received signal; and a second processor, configured to receive the gated signal from the first processor, and determine one of the plurality of energy regions to which the received signal belongs according to the turn-on period of the gated signal, so as to count signals within the determined energy region.

Apparatuses for processing signals for a plurality of energy regions, and systems and methods for detecting radiation of a plurality of energy regions

The present disclosure provides a method for recognizing an article using a multi-energy spectrum X-ray imaging system and a multi-energy spectrum X-ray imaging system. The method comprises: recognizing an application scenario and/or priori information of the article; selecting a parameter mode suitable for the article from a plurality of parameter modes stored in the multi-energy spectrum X-ray imaging system based on the recognized application scenario and/or priori information; and recognizing the article using the selected parameter mode, wherein the plurality of parameter modes are obtained by optimizing system parameters of the multi-energy spectrum X-ray imaging system under a specific condition using a training sample library for various articles.

Multi-energy spectrum x-ray imaging systems and methods for recognizing article using multi-energy spectrum x-ray imaging system

The present disclosure relates to a method, a device and a system for inspecting a moving object based on cosmic rays, pertaining to the field of radiation imaging and safety inspection techniques. The method includes: detecting whether a speed of the inspected moving object is within a preset range; recording a motion trajectory of the moving object with a monitoring device; acquiring information about charged particles in the cosmic rays with a position sensitive detector, the information about charged particles including track information of the charged particles; determining the moving object by matching positions of the motion trajectory and the track information; reconstructing the track of the charged particles according to the information about the charged particles; and recognizing the material inside the moving object based on the track reconstruction.

Method, device and system for inspecting moving object based on cosmic rays

The present application relates to a method, apparatus and system for inspecting an object based on a cosmic ray, pertaining to the technical field of radiometric imaging and safety inspection. The method includes: recording a movement trajectory of an inspected object by using a monitoring device; acquiring information of charged particles in the cosmic ray by using a position-sensitive detector, the information of charged particles comprising trajectory information of the charged particles; performing position coincidence for the movement trajectory and the trajectory information to determine the object; performing trajectory remodeling for the charged particles according to the information of charged particles; and identifying a material inside the moving object according to the trajectory remodeling. According to the present disclosure, pedestrians who are walking and moving are inspected by using the cosmic ray, and nuclear materials, drugs and explosive materials and the like carried by human bodies may be detected.

Method, apparatus and system for inspecting object based on cosmic ray

The present disclosure discloses an inspection device and a method for inspecting a container. Transmission scanning is performed on the inspected container using a scanning device including a sparse area array detector to obtain scan data. Digital focusing is performed at a specific depth position in a depth direction. Defocused pixel values are filtered out to obtain a slice image at the specific depth position. It is judged whether dangerous articles or suspicious articles are included in the slice image.

Inspection devices and methods for inspecting a container

Growing community of inventors

Beijing, China

Bicheng Liu