Taiwan Semiconductor Manufacturing Comp. Ltd.

Bharath Kumar Pulicherla

Chung-Cheng Wu

Gwan-Sin Chang

Kuo-An Liu

Chan-Lon Yang

Zhi-Qiang Wu

Chih-Han Lin

Pinyen Lin

Li-Te S Lin

Li-Jui Chen

Zhiqiang Wu

Sheng-Kang Yu

A semiconductor device includes a substrate having a semiconductor fin. A gate structure is over the semiconductor fin, in which the gate structure has a tapered profile and comprises a gate dielectric. A work function metal layer is over the gate dielectric, and a filling metal is over the work function metal layer. A gate spacer is along a sidewall of the gate structure, in which the work function metal layer is in contact with the gate dielectric and a top portion of the gate spacer. An epitaxy structure is over the semiconductor fin.

Semiconductor device and manufacturing method thereof

A method includes forming a gate layer over a semiconductor fin; forming a patterned mask over the gate layer; performing a first etching process to pattern the gate layer using the patterned mask as an etch mask, the patterned gate layer comprising a first gate extending across the semiconductor fin; depositing, by using an directional ion beam, a protection layer to wrap around a top surface, a first sidewall and a second sidewall of the first gate, the protection layer extending along the first and second sidewalls of the first gate towards a bottom surface of the first gate without extending to the bottom surface of the first gate on the second sidewall of the first gate; and after depositing the protection layer, performing a second etching process to a portion of the second sidewall of the first gate exposed by the protection layer.

Semiconductor structure and fabrication method thereof

A method includes forming a dummy gate over a substrate. A pair of gate spacers are formed on opposite sidewalls of the dummy gate. The dummy gate is removed to form a trench between the gate spacers. A first ion beam is directed to an upper portion of the trench, while leaving a lower portion of the trench substantially free from incidence of the first ion beam. The substrate is moved relative to the first ion beam during directing the first ion beam to the trench. A gate structure is formed in the trench.

An EUV collector mirror for an extreme ultra violet (EUV) radiation source apparatus includes an EUV collector mirror body on which a reflective layer as a reflective surface is disposed, a trajectory correcting device attached to or embedded in the EUV collector mirror body and a trajectory correcting device to adjust the trajectory of metal from the reflective surface of the EUV collector mirror body to an opposite side of the EUV collector mirror body.

Apparatus and method for prevention of contamination on collector of extreme ultraviolet light source

A semiconductor structure is disclosed that includes the fin structure and the plurality of gates. The plurality of gates disposed with respect to the fin structure and including the first gate, the second gate, and the third gate. The spacing between the first gate and the second gate is smaller than the spacing between the second gate and the third gate. The second gate is disposed between the first gate and the third gate. The foot portion of the first gate, facing the second gate, and the first foot portion of the second gate, facing the first gate, have no lateral extension. The second foot portion of the second gate, facing the third gate, and the foot portion of the third gate, facing the second gate, have no lateral extension and/or cut.

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Hsinchu, Taiwan

Bharath Kumar Pulicherla