Seagate Technology Incorporated

Bharat P Londhe

Jay Shah

Aniruddha Mukund Bhasale

Komal Shah

Deep Neema

A method includes injecting scan patterns into an input of a decompressor that distributes the scan patterns to a plurality of scan chains whose outputs are coupled to inputs of a compressor, which provides a compressed scan test result representing the plurality of scan chains. The method also includes, in response to the compressed scan test result being indicative of failure, identifying a particular scan chain of the plurality of scan chains that is responsible for the failure by a debug circuit that is coupled to the input of the decompressor and to a compressor output. The debug circuit enables an output of any single scan chain of the plurality of scan chains to be available at the compressor output while suppressing outputs of all other scan chains of the plurality of scan chains.

Programmable scan chain debug technique

An implementation of a system disclosed herein includes a decompressor logic with the capability to vary a level of decompression of a scanning input signal based on value of compression program bits and a compressor logic to generate a scanning output signal, the compressor logic including a plurality of XOR logics, wherein the output of the plurality of XOR logics is selected based on the compression program bits.

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Pune, India

Bharat P Londhe