Schlumberger Technology Corporation

Bharat Narasimhan

Adam Pedrycz

Hiroshi Hori

Jean-Christophe Auchere

Methods, apparatus, systems, and articles of manufacture are disclosed to measure a formation feature. An example apparatus includes a pre-processor to compare a first measurement obtained from a first sensor included in a logging tool at a first depth at a first time and a second measurement obtained from a second sensor included in the logging tool at the first depth at a second time. The example apparatus also include a semblance calculator to: calculate a correction factor based on a difference between the first measurement and the second measurement; and calculate a third measurement based on the correction factor and a fourth measurement obtained from the first sensor at a second depth at the second time. The example apparatus also includes a report generator to generate a report including the third measurement.

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Katy, TX, United States of America

Bharat Narasimhan