The Ohio State University

Ohio University

Bharat Bhushan

Christopher D Hahm

Philip Simon Brown

Jonathan P Pelz

David T Lee

James V Coe

Samuel Graeme Martin

Michael Nosonovsky

Balkishan Gupta

Yong Chae Jung

Articles including repellent surfaces and methods of making and using these articles are disclosed. The repellant surface can comprise a polymer having a roughened surface and a fluorinated silane and a lubricating liquid deposited on the roughened surface. The repellent surface, and by extension the articles described herein, can exhibit superomniphobic properties. The methods for producing the repellant surface can comprise dissolving a polymer in a solvent to produce a polymer solution and optionally adding a non-solvent to the polymer solution to produce a casting mixture. The polymer solution or casting mixture can be deposited on a surface of a substrate and the solvent and/or the non-solvent evaporated to provide a coated-substrate having a roughened surface. A functional layer comprising a fluorinated silane followed by a lubricating liquid can be deposited on the roughened surface to form the repellant surface.

Liquid impregnated surfaces for liquid repellancy

Provided herein are articles including repellent coatings, as well as methods of making as using these articles. The articles can comprise a substrate and a repellent coating disposed on a surface of the substrate. The repellant coating can comprise hydrophobic particles dispersed within a polymer binder. The hydrophobic particles can be aggregated within the polymer binder, thereby forming a multiplicity of re-entrant structures embedded within and protruding from the polymer binder. The repellent coatings, and by extension the articles described herein, can exhibit selective wetting properties (e.g., superhydrophilicty/super-oleophobicity, or super-hydrophobicity/superoleophilicity).

Coatings having adaptable wettability as well as methods of making and using thereof

Methods of making functional surfaces, including liquid repellant surfaces that can exhibit selective wetting properties. Methods of forming the functional surfaces can comprise providing a dispersion of nanoparticles; and applying the dispersion to a polymer surface to form a multiplicity of re-entrant structures embedded within and protruding from the polymer surface. The re-entrant structures are formed from aggregates of the nanoparticles. Functional surfaces are prepared by these methods, as well as articles comprising these functional surfaces.

Functional surfaces and methods of making thereof

Embodiments of methods of making superhydrophobic structures comprise depositing a polymer mold onto a silicon surface comprising a plurality of microasperities, removing the polymer mold after the polymer mold has hardened, depositing a liquid epoxy resin into the polymer mold, forming a microstructure with a plurality of microasperities by separating the epoxy resin from the mold after the epoxy resin has solidified, and forming a superhydrophobic structure by depositing a plurality of alkane nanoasperities on the microstructure in the presence of solvent vapor.

Hierarchical structures for superhydrophobic surfaces and methods of making

A method for measuring nm-scale tip-sample capacitance including (a) measuring a cantilever deflection and a change in probe-sample capacitance relative to a reference level as a function of a probe assembly height; (b) fitting out-of-contact data to a function; (c) subtracting the function from capacitance data to get a residual capacitance as a function of the probe assembly height; and (d) determining the residual capacitance at a z-position where the cantilever deflection is zero.

Method for measuring nm-scale tip-sample capacitance

A system and method for measuring capacitance between a probe and a semiconductor sample, which may be useful in the field of scanning capacitance microscopy (SCM). The present invention also includes a method for analyzing measured capacitance data by subtracting any changes in capacitance that are due to changes in long-range stray capacitance that occur when the probe assembly is scanned.

Direct, low frequency capacitance measurement for scanning capacitance microscopy

The present invention includes capacitive film thickness measurement devices and measurement systems. The invention also includes machines or instruments using those aspects of the invention. The present invention additionally includes methods and procedures using those devices of the present invention. The present invention discloses a capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Using the present invention, variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.

Method for measuring film thickness using capacitance technique

Capacitive film thickness measurement devices and measurement systems used in machines or instruments. A capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.

Pin and cup devices for measuring film thickness

Liquid dielectric capacitor for film thickness mapping

The present invention includes capacitive film thickness measurement devices and measurement systems used in machines or instruments. A capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Using the present invention, variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.

Liquid dielectric capacitor for film thickness mapping, measurement methods using same

The present invention includes capacitive film thickness measurement devices and measurement systems. The invention also includes machines or instruments using those aspects of the invention. The present invention additionally includes methods and procedures using those devices of the present invention. The present invention discloses a capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Also disclosed is a device and technique for determining film thickness by suspending the film in a liquid dielectric. Using the present invention, variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.

Capacitance devices for film thickness mapping, measurement methods using same

Scanning capacitance device for film thickness mapping featuring enhanced lateral resolution, measurement methods using same

A low friction non-gaussian surface is disclosed which has a positive skewness value and a kurtosis value of three or greater which minimizes static and kinetic friction and resultant wear in any instance of at least two surfaces in moving contact, including machine and computer components, magnetic media, and read/write heads which contact magnetic media. In a preferred embodiment, a magnetic media having an optimal non-gaussian surface roughness and method of surface parameter selection utilizes non-gaussian probability density functions in a contact model which accounts for the effects of roughness distribution and liquid film meniscus forces to determine optimum skewness and kurtosis values which minimize static and kinetic friction. The invention provides a magnetic media or other article of manufacture with a surface which has a positive skewness value and as high a kurtosis value as possible which minimizes or reduces static and kinetic friction and wear upon contact with another surface which may also be surface configured in accordance with the invention.

Surfaces having optimized skewness and kurtosis parameters for reduced

A low friction non-gaussian surface is disclosed which has a positive skewness value and a kurtosis value of three or greater which minimizes static and kinetic friction and resultant wear. In a preferred embodiment, a magnetic storage media having an optimal non-gaussian surface roughness and method of surface parameter selection utilizes non-gaussian probability density functions in a contact model which accounts for the effects of roughness distribution and liquid film meniscus forces to determine optimum skewness and kurtosis values which minimize static and kinetic friction. The invention provides a magnetic storage media with a surface which has a positive skewness value and as high a kurtosis value as possible which minimizes static and kinetic friction at the disk/head interface and minimizes wear of the magnetic storage device.

Method of texturing a magnetic recording medium for optimum skewness and

The invention relates to an improved synthesis of fullerene (C.sub.60) films, whereby improved purity and adhesion to a substrate are achieved. The invention is not limited to C.sub.60 molecules and other fullerenes and fullerene based materials, including for example, metallofullerenes, fluorinated fullerenes, and codeposition of fullerene and other solid lubricants. The invention also relates to the use of these fullerene materials in oils, greases, polymers and other materials, both organic and inorganic, for improving lubrication and wear life. The invention further relates to a process for the ion bombardment of fullerene materials, including but not limited to, C.sub.60 fullerene materials to improve their tribological properties.

Growing community of inventors

Powell, OH, United States of America

Bharat Bhushan