E2v Semiconductors

Bertrand De Monte

Frédéric Mayer

The invention relates to time delay integration (TDI) image sensors. The sensor includes means for detecting a shift of the sensor with respect to the image. The pixel matrix is divided in the column direction into at least a first and a second sub-matrix (Ma, Mb). On each side of each sub-matrix are arranged groups of additional columns (GRa, GRb, GRa, GRb). The shifts (Db&#x2212;Da, Db&#x2212;Da, etc.) in relative position of these groups between the first and the second sub-matrices are different from each other and make it possible to detect a relative shift of the sensor during travel. More precisely, the signals originating from groups of columns of same rank associated with the two sub-matrices are compared. The pair of groups that delivers the pair of signals that are closest to each other defines the probable shift of the sensor with respect to the image: this shift is equal to the relative position difference of these two groups.

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Saint Egreve, France

Bertrand De Monte