Qcify Inc.

Qcify Inv.

Bert Switten

Raf Peeters

Joachim Van Der Perre

Pieter Boogaerts

Bert Peelaers

An adaptable inspection and sorting unit includes an attachment mechanism, an inspection sensor device that is capable of inspecting a sample, a sorting device that is capable of deflecting the sample, a data port that is capable of receiving information, and a power port that is connectable to a power source. The attachment mechanism, the inspection device, the sorting device, the data port, and the power port are physically connected together. A memory circuit and a processor circuit read information received via the data port, control the inspection sensor device, and control the sorting device. The adaptable inspection and sorting unit is capable of inspecting and deflecting a sample traveling along the processing line. The speed of the sample is measured utilized to determine a delay between inspecting the sample and sorting the sample.

Adaptable inspection and sorting unit

A method for generating a quality inspection data block for a distributed ledger includes: determining an identification code associated with a sample to be inspected, inspecting the sample and thereby generating quality inspection data associated with the sample, and after completion of the inspecting of the sample combining the identification code and the quality inspection data into the quality inspection data block. The method also includes adding the quality inspection data block to the distributed ledger. An inspector including a sensor that senses a characteristic of a sample, a memory that stores sensor output data, and a processor configured to: determine an identification code associated with a sample to be inspected, generate quality inspection data based on the sensor output data, and combine the identification code and the quality inspection data into a quality inspection data block. In one example, the inspector is an in-flight 3D inspector.

Quality inspection data distributed ledger

A sub stream auto sampling system includes an inspection unit and a sorter unit. The inspection unit includes a camera configured to capture an image of a sample, a light configured to illuminate a sample, a processor configured to process the captured image, and a memory configured to store the captured image. The sorter unit is configured to divert a sub stream of samples, from a main stream of samples, toward the inspection unit. The output of the inspection unit may be directed to the main stream of samples, or the output of the inspection unit may be directed to a collection unit. In addition to the inspection performed by the inspection unit, weighing of the sub stream of samples may also be performed by a weighing unit before the sub stream of samples are routed to the main stream of samples or the collection unit.

Sub stream auto sampling

An adaptable sorter unit includes an attachment mechanism, a sorting device that is capable of deflecting a sample, a data port that is capable of receiving information, and a power port that is connectable to a power source. The attachment mechanism, the sorting device, the data port, and the power port are physically connected together. The adaptable sorter unit also includes a memory circuit and a processor circuit configured to read information received via the data port and control the sorting device. The sorting device is a vacuum system, a mechanical pedal system, or an air jet system. The attachment mechanism is a mounting bracket, a mounting bracket receptacle, a weldable material, a clamp, a bolt, or a screw. The attachment mechanism connects the adaptable sorter unit to a processing line such that the adaptable sorter unit is capable of deflecting a sample traveling along the processing line.

Adaptable sorter unit for existing processing lines

An adaptable inspection unit includes an attachment mechanism, an inspection sensor device, a data port that is capable of transmitting information, and a power port that is connectable to a power source, all of which are physically connected together. The adaptable inspection unit also includes a memory circuit and a processor circuit. The processing circuit controls the inspection sensor device and writes information transmitted via the data port. The attachment mechanism is a mounting bracket, a mounting bracket receptacle, a weldable material, a clamp, an adhesive, a magnet, a latch, a lock, a locating pin, a rail, a slide, locking pin, a bolt, a screw, gravity or friction. The attachment mechanism is used to connect the adaptable inspection unit to a processing line such that the adaptable inspection unit is capable of capturing an image of a sample traveling along the processing line.

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Sacramento, CA, United States of America

Bert Switten