Agilent Technologies, Inc.

Verigy (Singapore) Pte. Ltd.

Hewlett-Packard Company

Schoppe, Zimmerman, Stockeler & Zinkler

Verigy Pte. Ltd.

Bernhard Roth

Henriette Ossoinig

A communication circuit for providing a bi-directional data transmission over a signal line, thereby receiving a first digital data stream and transmitting a corresponding first signal into a near end of a signal line to a remote device, the remote device being connected to a far end of the signal line, receiving a second signal at the near end of the signal line from the remote device and deriving a second digital data stream therefrom, having a replica generator for providing, in response to the first digital data stream or a signal derived therefrom, a replica signal, and an extraction circuit for extracting the second digital data stream from the second signal in response to the replica signal and a comparator signal deduced from the near end of the signal line and an automatic test equipment having a plurality of communication circuits each providing a bi-directional data transmission.

Communication circuit for a bi-directional data transmission

An apparatus for obtaining a time-domain-reflection response-information has a signal driver adapted to apply two pulses of different pulse lengths to a TDR port in order to excite a first TDR response signal corresponding to a first pulse and a second TDR response signal corresponding to a second pulse. The apparatus has a timing determinator adapted to provide a timing information on the basis of a first instance in time when the first TDR response signal crosses a threshold value and on the basis of a second instance in time when the second TDR response signal crosses the threshold value. The apparatus has a TDR response information calculator adapted to calculate an information about a TDR response on the basis of the timing information.

Apparatus, method, and computer program for obtaining a time-domain-reflection response-information

An electrical test circuit includes a bridge configuration having two paths between two nodes, a buffer, and a capacitor. An output of the buffer is coupled to one of the paths, the buffer is adapted to either provide a defined potential or a high impedance, the capacitor is connected to the output of the buffer, and a signal of a device under test is adapted to be coupled to another one of the paths. One of the nodes of the bridge configuration can be supplied with a first current, and the other one of the nodes of the bridge configuration can be supplied with a second current.

Electrical test circuit with active-load and output sampling capability

An electronic circuit for automatic test equipment for testing a device under test includes two lines for connecting the circuit with a device under test. Two comparators are provided, one input of each of the comparators being connected to different ones of the two lines. A further comparator is provided, the two inputs of the further comparator being connected to different ones of the two lines. Each of the two lines is terminated. Switching elements are provided which are connected between the two lines. The switching elements enable the circuit to be used in different modes, in particular with a single-ended termination and with a differential termination.

Automatic test equipment for testing a device under test

A circuit provides an output signal in accordance with crossing points of a differential signal, which includes a normal input signal and a complementary input signal. The circuit includes a first amplifier for amplifying a first signal difference between the normal input signal and a first threshold value, and for providing as a first output signal the amplified first signal difference. The circuit includes a second amplifier for amplifying a second signal difference between the complementary input signal and a second threshold value, and for providing as a second output signal the amplified second signal difference. The circuit also includes a first comparator for providing a first logical level when a third signal difference between the first output signal and the second output signal is greater than a third threshold value, and for providing a second logical level when the third signal difference is smaller than the third threshold value.

Circuit for providing a logical output signal in accordance with crossing points of differential signals

Disclosed is a compensation circuit for compensating a change in timing information of an input signal caused by thermal variations in a first circuit. The first circuit comprises one or more devices each having a temperature dependent on the input signal. Accordingly, the compensation circuit comprises one or more compensation devices each having a temperature dependent on the input signal. The compensation circuit is connected in series with the first circuit and the series connection receives the input signal and provides a timing-compensated output signal with substantially the same timing information as of the input signal. The thermal characteristic of at least one of the one or more compensation devices is proportional or in some other known relation to a corresponding one of the one or more devices of the first circuit. The compensation circuit provides a compensation output signal having substantially opposite or inverse thermal distortions than the first circuit.

Compensation of timing errors caused by dynamic thermal mismatch

Described is an attenuation equalizer for compensating an attenuation characteristic of a transmission line, including a first node and a second node, a first frequency filter unit coupled to the first node and/or to the second node for frequency filtering an applied signal, a first current source coupled to the first node in order to control a current provided by the first current source to the second node.

Growing community of inventors

Boeblingen, Germany

Bernhard Roth