Research Center for Non Destructive Testing Gmbh

Constantia Teich Gmbh

Fill Gesellschaft M.b.h.

Bernhard Reitinger

Martin Kornfeld

Alfred Wegenberger

Saeid Zamiri

Juergen Roither

Clemens Gruensteidl

Clemens GRÜNSTEIDL

Jürgen Roither

For a simple, fast, safe and reliable determination of the layer thickness of a bonding layer between two layers of a packaging, a laser ultrasonic method is provided, in which the transit time of the ultrasonic wave through the first and second packaging layers () is determined in advance, and a maximum (M, M, M) in the measurement signal (S) is sought, and the point in time of occurrence of this maximum (M, M, M) is determined as the total transit time (T, T, T) of the ultrasonic wave, and the transit time of the ultrasonic wave through the first and second packaging layers () is subtracted from the total transit time (T, T, T), and the thickness (d) of the bonding layer is deduced from the known ultrasonic speed (v) in the bonding layer ().

Method for determining the layer thickness of a connecting layer between two packaging layers

A method for laser-optical detection of a surface movement of a sample () is specified, whereby a first laser reference beam () is superimposed with a first laser measurement beam () directed onto the sample () and reflected by the latter in a first photorefractive/electro-optical element (). In addition, a second reference beam () identical to the first reference beam () is superimposed with a second measurement beam () identical to the first measurement beam () in a second photorefractive/electro-optical element (). Mutually inverse voltages are applied to the two photorefractive/electro-optical elements (). The light emerging from the photorefractive/electro-optical elements () is converted into electric signals which are subtracted from one another prior to the signal evaluation. Also specified is an arrangement for implementing said method.

Method and device for laser-optical detection of a surface movement of a sample using reference beams respectively superimposed on measurement beams in photorefractive/electro-optical elements

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Alkoven, Austria

Bernhard Reitinger