Roche Diagnostics Operations, Inc.

Bernd Stenkamp

Bernhard Kern

Wilfried Schmid

Michael Schabbach

Jochen Schulat

Stefan Kalveram

Wolfgang Schwoebel

Dieter Meinecke

Gertrud Albrecht

Andreas Menke

Ute Hübner

Guenter Schmelzeisen-Redeker

Kai Dickopf

The invention relates an analysis system having a positioning device for positioning a test element and a method for positioning the test element in the analysis system. The positioning device has a support surface for supporting the test element. A first switch component sits on the support element. A second switch component is positioned parallel to the first switch component. A connection is established when the second switch component is positioned in recess on the test element due to the displacement of the second switch component relative to the first switch component.

Positioning device for a test element

The invention relates to embodiments of a method and a system for monitoring the correct positioning of a test element in a test element receptacle of an analysis unit, the test element carrying a sample to be analyzed by the analysis unit. Using a delimiting element, responsive signals resulting from irradiating an analysis region on the test element are effectively prevented from impinging upon a signal detector when the analysis region is in an incorrect position relative to the analysis unit. The delimiting element is provided with a light-opaque region and a light-transmissive region, and the light-opaque region is positioned such that responsive signals impinge upon it rather than the light-transmissive region when the analysis region is in an incorrect position. The embodiments of the invention further relate to methods and systems configured to further analyze the sample, to determine whether the sample has been underdosed, and additional position monitoring steps comprising irradiating different partial regions of the analysis region and comparing the detection signals responsive to each to a predetermined limit value.

Method for analyzing a sample on a test element and analysis system for same

Growing community of inventors

Heidelberg, Germany

Bernd Stenkamp