Dilor

Horiba Jobin Yvon Sas

Jobin Yvon S.a.

Bernard Roussel

Edouard Da Silva

Michel DelHaye

Alexandra Rapaport

Emmanuel Froigneux

Michel Leclercq

Alexandre Kokota

Michel Delhaye

A spectroscopic imaging system includes a microscopic or macroscopic device including an objective, a housing including a spectroscope, and scanning means disposed between the objective and the spectroscope. During the scanning of the excitation beam on a scanned area on the sample surface, the energy of the emitted light beam is integrated on the pixels of the detection means, generating average spectral data for each line of pixels. Storage means are connected to the detection means, including a memory able to store average spectral data of M lines of pixels. An imaging device is connected to the storage means, and the average spectral data of M lines of pixels are sent simultaneously toward the imaging device in order to obtain an average spectroscopic image of the scanned area.

Spectroscopic imaging method and system for exploring the surface of a sample

An inelastic diffusion spectrometric imaging apparatus includes an illuminating and energising system including a confocal first aperture and a second confocal aperture combined with the first. A first deflector assembly scanning for scanning a sample and a second deflector assembly sychronised with the first, are placed respectively downstream and upstream of the second confocal aperture and a spectrometer. The input aperture of the spectrometer merges with the second confocal aperture.

Spectrometric imaging apparatus

In an optical fittering device comprising at least two fitters, the first filter (EF1) is tilted by an angle of incidence whose value is adjusted to bring the cut-off limit of the first filter (EF1) closer to one of the sides of the line of the illumination beam (FLA), which reduces the optical density of the first filter, while the association in series of the first (EF1) and second (EF2) filters enables to obtain a high-pass filtering whose global density corresponds to the sum of the densities of the first and second filters and whose cut-off limit is lower than that obtained by a single filter tilted to its optimum angle. A third filter (EF3) mounted in parallel with respect to the first and second filters (EF1 and EF2) enables to obtain, at the level of the common collection path (TCC), a band eliminating filtering whose cut-off limits are positioned on either side of the illumination line with a view to an optimum analysis of the low frequency lines.

Process and device for optimizing the position and the width of the

The invention relates to a spectrometry installation comprising an inlet, optical fiber means suitable for receiving an inlet beam and delivering a spectrally dispersed image of the beam which image is limited to a selected spectral band, a multi-channel detection module receiving said spectral image, and processor means. The optical filter means are provided with a deflector stage. Control means are associated with the optical deflector means to define the spectral band in terms of center frequency and band width, and control means are associated therewith for displacing the spectral image over the detection module. An electronic control unit is provided to control the control means and to control the processor means in a plurality of operating modes, each of which comprises joint control of the selected spectral band, of the displacement of the spectral image, and of the processor means, for the purpose of selectively using a particular set of detector components.

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Valenciennes, France

Bernard Roussel