Seagate Technology Incorporated

Bernard Alan Russick

Michael D Schaff

A method and apparatus for selecting an optimized write current for a write head to improve read performance from a track-of-interest on a storage disc. Read error rates are detected from a test pattern written to the track-of-interest using a plurality of test write currents. The read error rates are detected over a range of read positions offset from the track-of-interest. Off-track read capability (OTC) values corresponding to each test write current are determined based on the read error rates that satisfy an acceptable error rate criterion. The test write current that corresponds to the maximum OTC value is selected as the optimized write current. An optimized write current value corresponding to the optimized write current and a head value corresponding to the write head are associatively stored in a storage unit, and the values are read from the storage unit and the optimized write current is supplied to the write head in accordance to the optimized write current value.

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Niwot, CO, United States of America

Bernard Alan Russick