Samsung Electronics Co., Ltd.

Beom Seok Shin

Jinsoo Park

Eui Seok Kim

Won Soo Ji

Choo Ho Kim

Min Hwan Kim

Beom Hak Lee

Sangwoo Rhim

Sung Hoon Oh

A system-on-chip includes a first scan register being in a first core and being closest to an input port of the first core; an inverting circuit on a feedback path of the first scan register; a second scan register in the first core; and a logic circuit on a data path between the first scan register and the second scan register. In a test mode for an AT-SPEED test of the logic circuit, the inverting circuit generates test data by inverting scan data that are output from the first scan register, the first scan register stores the test data in response to a first pulse of a clock signal, the logic circuit generates result data based on the test data that are output from the first scan register, and the second scan register stores the result data in response to a second pulse of the clock signal.

System-on-chip for AT-SPEED test of logic circuit and operating method thereof

System-on-chip for at-speed test of logic circuit and operating method thereof

An apparatus for manufacturing an light emitting diode (LED) package, includes: a heating unit heating an LED package array in a lead frame state in which a plurality of LED packages are installed to be set in an array on a lead frame; a testing unit testing an operational state of each of the LED packages in the LED package array by applying a voltage or a current to the LED package array heated by the heating unit; and a cutting unit cutting only an LED package determined to be a functional product or an LED package determined to be a defective product from the lead frame to remove the same according to the testing results of the testing unit.

Method for removing defective light emitting diode (LED) package from LED package arrary

A network control apparatus and network control method is provided. The network control apparatus including: a content addressable memory receiving to store a plurality of addresses which are generated by at least one master intellectual property, determining whether data corresponding to each of the plurality of stored addresses is received, and generating a determination signal; and a packet decoder transmitting each of the plurality of stored addresses and the data corresponding to each of the plurality of stored addresses to a slave intellectual property according to the determination signal. Accordingly, a multiple address issue function can be supported.

Apparatus and method for network control

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Seoul, South Korea

Beom Seok Shin