Samsung Electronics Co., Ltd.

Beom-Kyu Shin

Jun-Jin Kong

Dong-Min Shin

Sung-Kyu Park

Myung-Kyu Lee

Jae-Yong Jeong

Kui-Yon Mun

Eun-chu Oh

Pil-sang Yoon

Eun-cheol Kim

Young-Seok Hong

Ung-hwan Kim

Geun-Yeong Yu

Jong-Ha Kim

Ji-Youp Kim

Provided are a memory controller with improved data reliability, a memory system including the memory controller, and a method of operating the memory controller. The memory controller includes an error correction code (ECC) circuit configured to perform an error detection on a codeword read from a memory device; and a processor configured to set at least one memory chip from among a plurality of memory chips as an indicator chip, monitor an error occurrence in the indicator chip based on a result of the error detection, and output reliability deterioration information indicating that the reliability of the memory device is deteriorated based on a result of the monitoring.

Memory controller including ECC circuit, memory system having the same, and method of operating memory system and memory controller

A method of controlling a first memory controller that controls a non-volatile memory device includes: the first memory controller receiving first data and a first physical address from a second memory controller via a first interface of the first memory controller; the first memory controller storing the first data in a non-volatile memory buffer of the first memory controller; and the first memory controller programming the first data stored in the non-volatile memory buffer in a first physical region of the non-volatile memory device corresponding to the first physical address.

Method of operating memory controller and memory system, and the memory system

A method and system of recovering data includes reading reference codewords, which have code correlation with a target codeword, from a memory device when an error-correcting code (ECC) decoding process for a decoder input of the target codeword has failed. A decoder input of a corrected target codeword is generated based on an operation process using the target codeword and the reference codewords. An ECC decoding process is performed again on the decoder input of the corrected target codeword.

Method of recovering data and memory system and raid storage system using the same

A method of operating a memory system includes receiving information data corresponding to a second program unit that is a part of a first program unit and a write request for the information data from a host; generating a codeword by performing error correction code (ECC) encoding on the received information data such that a partial parity bit corresponding to the information data among all parity bits of the codeword is updated; and providing a memory device with the generated codeword and a write command regarding the codeword.

Memory system and method of operating the memory system

A method of estimating a deterioration state of a memory device comprises reading data from selected memory cells connected to a selected wordline of a memory cell array by applying to the selected wordline a plurality of distinct read voltages having values corresponding to at least one valley of threshold voltage distributions of the selected memory cells, generating quality estimation information indicating states of the threshold voltage distributions using the data read from the selected memory cells, and determining a deterioration state of a storage area including the selected memory cells based on the generated quality estimation information.

Method of estimating deterioration state of memory device and related method of wear leveling

Growing community of inventors

Seongnam-si, South Korea

Beom-Kyu Shin