Forensic Technology Wai, Inc.

Ultra Electronics Forensic Technology Inc.

Benoit Perron

Danny Roberge

Alain Beauchamp

There is provided a method for analyzing at least one object under a first microscope and a second microscope concurrently by linking the two microscopes together. Movement of one microscope will result in movement of the other. This is done by computing a transformation to link a first coordinate system and a second coordinate system and generating guidance data when one of the two microscopes is displaced, the guidance data corresponding to a set of operations to be applied to the other microscope to follow movement of the microscope that is displaced.

Linking of microscopes for analysis of objects comprising tool marks

There is provided a method for generating a 3D representation of an object, comprising: acquiring 3D topographic data representative of at least one portion of the object having a macroscopic form and microscopic features; separating the 3D topographic data into microscopic data representative of the microscopic features and macroscopic data representative of the macroscopic form; independently scaling one of the microscopic data and the macroscopic data in order to enhance the microscopic features with respect to the macroscopic form, thereby obtaining scaled topographic data; and generating a 3D image using the scaled topographic data, thereby obtaining a modified representation having enhanced microscopic features for the at least one portion of the object.

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Boucherville, Canada

Benoit Perron