International Business Machines Corporation

Benjamin Neil Trombley

Paul Gerard Villarrubia

Gi-Joon Nam

Myung-Chul Kim

Shyam Ramji

Lakshmi Narasimha Reddy

Alexander Joel Suess

Gustavo Enrique Tellez

Alexey Y Lvov

Hua Xiang

Arjen Alexander Mets

Chung-Lung K Shum

Patrick James Meaney

Michael H Wood

David S Wolpert

Leon Jacob Sigal

Basanth Jagannathan

Bodo Hoppe

Nathaniel Douglas Hieter

Shiri Moran

Douglas G Balazich

David John Geiger

Erica Stuecheli

Karl Evan Smock Anderson

Arvind Haran

Daniel Arthur Gay

James Leland

Embodiments are provided for providing enhanced routing in a computing system by a processor. One or more of a plurality of short nets in a cell of an integrated circuit may be aligned for executing a routing operation, wherein a short net is a two-pin net having two gates on adjacent rows having a horizontal distance less than a selected threshold.

Short net pin alignment for routing

Embodiments are provided for enhanced initial global placement in a circuit design in a computing system by a processor. A wire length minimization may be determined based on maximum population density constraints as a single player game theory for global placement of an integrated circuit.

Enhanced alignment for global placement in a circuit

Embodiments are provided for providing power staple avoidance during routing in a computing system by a processor. One or more transistor gates may be shifted in each row of an integrated circuit to avoid alignment of cell pins and power staples for executing a routing operation, where the circuit row is partitioned into segments based on one or more fixed objects.

Power staple avoidance for routing via reduction

Error protection analysis of an integrated circuit includes receiving a design model for the integrated circuit, and a list of error checkers associated with the design model. The design model is traversed from each of the error checkers to group storage cells of the design model into checking groups. The design model is updated to include, for each checking group, a unique group identifier associated with each of the storage cells in the checking group.

Error protection analysis of an integrated circuit

Embodiments for power generation include defining a power tile within a power distribution network having a grid of power rails, the power tile having logic gates, and applying an initial power grid pattern from a plurality of power grid patterns for the power tile such that initial power grid pattern relates to timing characteristics of the logic gates of the power tile. The power grid patterns each have a different number of connectors connecting one power rail to another power rail in the grid of power rails. A subsequent power grid pattern is selected from the power grid patterns for the power tile such that the subsequent power grid pattern meets a threshold condition for the timing characteristics of the logic gates of the power tile. The timing characteristics for the logic gates are determined based on a voltage drop associated with the subsequent power grid pattern.

Region-based power grid generation through modification of an initial power grid based on timing analysis

Carry out an initial wire-length-driven placement for an integrated circuit design embodied in an unplaced netlist, using a computerized placer, to obtain a data structure representing initial placements of logic gates. Identify at least one timing-critical source-sink path between at least one pair of source-sink endpoints in the data structure representing the initial placements. Create a new pseudo two-pin net for each pair of the at least one pair of source-sink endpoints to create an updated netlist. Carry out a revised wire-length-driven placement on the updated netlist to obtain a data structure representing revised placements.

Path-based timing driven placement using iterative pseudo netlist changes

A system and method to perform physical synthesis to transition a logic design to a physical layout of an integrated circuit include obtaining an initial netlist that indicates all components of the integrated circuit including memory elements and edges that interconnect the components. The method also includes generating a graph with at least one of the memory elements and the edges carrying one or more signals to the at least one of the memory elements or from the at least one of the memory elements. The components other than memory elements are not indicated individually on the graph. The netlist is updated based on the graph.

Memory element graph-based placement in integrated circuit design

A method includes receiving a source file specifying circuit components and electrical connections therebetween. At least a portion of the circuit components and electrical connections are within one or more of a set of logical hierarchical groupings, and a given one of the groupings has one or more electrical connections to at least another one of the groupings. The method also includes selecting an initial subset of the groupings based on one or more characteristics of respective ones of the set of groupings and performing individual logical optimization of respective ones of the initial subset. The method further includes determining a revised subset based on the one or more characteristics of the respective ones of the set of groupings as modified by the logical optimization, and performing global physical optimization of the circuit components and electrical connections based at least in part on the revised subset.

Hierarchy-driven logical and physical synthesis co-optimization

A system and method of performing model-based refinement of a placement of components in integrated circuit generation select one of the components as a candidate component and postulate a move of the candidate component from an original position to a new position. The method includes defining nets associated with the candidate component. An initial perimeter and a new perimeter associated with each of the one or more nets are defined. The initial perimeter includes the candidate component at its original position and the new perimeter includes the candidate component at its new position. The method includes quantifying a change from the initial perimeter and the new perimeter and the original position and the new position, and obtaining a model of wires interconnecting the candidate component to the components of each of the nets. A result of the placement is provided for manufacture of the integrated circuit.

Model-based refinement of the placement process in integrated circuit generation

The performance of a computer performing electronic design analysis is improved by representing a putative circuit design as a set of movable blocks of predetermined size which must fit into a bounding box (said blocks include a plurality of subsets to be interconnected by wires) and initially placing the set of blocks by quadratic initialization. Each of the blocks has first and second coordinates and weights are assigned to nets connecting those of the blocks within the subsets, the quadratic initialization in turn includes determining a cost of each of the nets connecting any two of the blocks within the subsets as one-half of a sum of squares of distances between the any two of the blocks; and minimizing a total cost over all of the nets to determine an initial placement of the set of blocks. Analytical placement is then carried out based on the initial quadratic placement.

Enhancing stability of half perimeter wire length (HPWL)-driven analytical placement

A putative circuit design is represented as a set of movable blocks of predetermined size which must fit into a bounding box, with a plurality of subsets to be interconnected by wires. A total weighted wire length is determined as a function of coordinates of centers of the movable blocks by summing a half perimeter wire length over the plurality of subsets, and a density penalty is determined as a convolution of an indicator function of the current placement and a convolution kernel, via incremental integer computation without use of floating point arithmetic. Blocks are moved to minimize a penalty function which is the sum of the total weighted wire length and the product of a density penalty weight and the density penalty. The process repeats until a maximum value of the density penalty weight is reached or the density penalty approaches zero.

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Hopewell Junction, NY, United States of America

Benjamin Neil Trombley