First Solar, Inc.

Benjamin Milliron

Rick C Powell

Markus Gloeckler

Zhibo Zhao

Jigish Trivedi

Arnold Allenic

Zhigang Ban

Feng Liao

Kenneth Ring

Andrei Los

Dan Damjanovic

Aaron Roggelin

Gopal Mor

Dan Mao

John Barden

Benyamin Buller

Xilin Peng

William F Logan

Dale Roberts

Jianjun Wang

Oomman K Varghese

David Berger

Joshua Brubaker

Joan King

Jay Norman

Jason Robinson

John Tumbush

A method for annealing an absorber layer is disclosed, the method including contacting a surface of the absorber layer with an annealing material provided as a gel. The annealing material comprises cadmium chloride and a thickening agent. A viscosity of the gel of the annealing material is greater than or equal to 5 millipascal seconds.

Annealing materials and methods for annealing photovoltaic devices with annealing materials

A photovoltaic device includes a substrate structure and at least one Se-containing layer, such as a CdSeTe layer. A process for manufacturing the photovoltaic device includes forming the CdSeTe layer over a substrate by at least one of sputtering, evaporation deposition, CVD, chemical bath deposition process, and vapor transport deposition process. The process can also include controlling a thickness range of the Se-containing layer.

Photovoltaic devices and method of manufacturing

A photovoltaic device is disclosed including at least one Cadmium Sulfide Telluride (CdSTe) layer as are methods of forming such a photovoltaic device.

High efficiency photovoltaic device employing cadmium sulfide telluride and method of manufacture

A multi-stage method and apparatus for vaporizing and depositing a tellurium containing semiconductor material on a substrate.

Method and apparatus providing multi-step deposition of thin film layer

Infrared detection is used to monitor the temperature within a vapor transport deposition processing chamber. Changes in temperature that occur when a substrate passes an infrared detector are detected and used to precisely locate a position of the substrate within the chamber. Position correction of the substrate can also be implemented.

In situ substrate detection for a processing system using infrared detection

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Toledo, OH, United States of America

Benjamin Milliron