Corning Incorporated

Emhart Glass Machinery Investments Inc.

Benjamin L Hall

Chung-En Zah

Martin Hai Hu

Catherine Genevieve Caneau

Leo B Baldwin

Nobuhiko Nishiyama

Mike J White

An array tester () characterizes individual ones () of a semiconductor devices of an array () based on polarization-resolving an optical far-field measurement of the individual chips () as a function of angular position. Two pairs of TM and TE detectors (-and-) or one pair displaceable by ninety degrees, move in vertical and horizontal arc paths or fixed around a fixed position of a selected device of an array to sample the far-fields.

Semiconductor array tester

A method of fabricating an indium phosphide-based vertical cavity surface emitting laser (VCSEL) having a high reflectivity distributed Bragg reflector (DBR) that is particularly adapted for emitting a light having a center wavelength of around 1.30 micrometers. The method includes the steps of selecting a specific operating wavelength, determining the photon energy corresponding to the selected operating wavelength, selecting a maximum operating temperature in degrees Centigrade, and fabricating at least half of the high index layers of the distributed Bragg reflector (DBR) of the VCSEL from AlGaInAs or other material that can be epitaxially grown on the InP substrate to have a band gap equal to or greater than the sum of the photon energy (in milli-electron volts) plus the sum of the maximum operating temperature plus 110 divided by 1.96. The manufacture of the high index layers with such a band gap creates a sufficient difference in the indices of refraction of the alternating layers in the DBR, while keeping optical absorption low to maintain the reflectivity at least up to the desired maximum temperature, and obviates the need for using a DBR either bonded to the InP substrate, or grown metamorphically on it.

Method of manufacturing an InP based vertical cavity surface emitting laser and device produced therefrom

A machine for inspecting the bottom of a glass container having an opening at the top thereof comprising means for delivering a glass container to an inspection station, the inspection station including a two dimensional camera having an imaging surface for viewing the bottom of the glass container through the opening of the bottle, a light source for directing light through the bottom of the container towards the imaging surface, a computer for evaluating the viewed bottom imaged on the imaging surface, and means for reducing the dynamic brightness range for the viewed bottom image including a spatial modulator located between the imaging surface and the light source and the computer complimenting and transferring the image of the glass container on the imaging surface to the spatial light modulator.

Machine for inspecting the bottom of glass containers

Growing community of inventors

Corning, NY, United States of America

Benjamin L Hall