Protochips, Inc.

Benjamin Jacobs

John Damiano, Jr

David P Nackashi

Daniel Stephen Gardiner

Franklin Stampley Walden, Ii

Mark Alan Uebel

Alan Philip Franks

Joshua Friend

Katherine Elizabeth Marusak

Nelson L Marthe, Jr

Benjamin Bradshaw Larson

Ii Franklin Stampley Walden

Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.

Automated application of drift correction to sample studied under electron microscope

Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.

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Apex, NC, United States of America

Benjamin Jacobs