Infineon Technologies Ag

Benjamin Finke

Herbert Gietler

Gerhard Zojer

An integrated circuit as described herein includes an upper interconnect level including a continuous upper interconnect area, the continuous upper interconnect area including a plurality of upper contact openings. The integrated circuit further includes a lower interconnect level including a continuous lower interconnect area, the continuous lower interconnect area including a plurality of lower contact openings. First contacts extend through the lower contact openings to the upper interconnect area and second contact openings extend through the upper contact openings to the lower interconnect area.

Integrated circuit including interconnect levels

A circuit arrangement comprises a fuse element from which degradation can start. The circuit arrangement also comprises a sensor element for detecting the degradation, and a circuit part to be protected. The sensor element can detect degradation into a region between the fuse element and the circuit part to be protected.

Growing community of inventors

Schiefling am See, Austria

Benjamin Finke