General Electric Company

General Electric Corporation Gmbh

Benjamin Didier Réne Wimille

Jean Lienard

Vincent Jonas Bismuth

Mathieu Seval

Vincent Auvray

Mylene Roussel

Guillaume Bacher

Julien Georges Heyman

A method for the correction of lag charges in a flat-panel X-ray detector makes it possible, for each integration phase of the detector, to determine an initial read phase situated just before said integration phase. The method of the invention enables the measurement, for each integration phase, of the charges present in the detector at the corresponding initial read phase, the production of a lag image from the latent charges measured in the initial read phase and the subtraction of the lag image from the raw image. The use of the measurement of charges enables the direct correction of the lag image in the acquisition without the use of a correction module as in the prior art.

Method for the correction of lag charge in a flat-panel X-ray detector

A method and apparatus for reduction of noise in an image of a sequence of fluoroscopic images of an object in motion having a differentiation of the pixels of the image between pixels in motion and fixed pixels, and a processing wherein a time filtering operation of the fixed pixels. For each pixel of the image, the differentiation between a pixel in motion and a fixed pixel is performed as a function of the result of a detection of motion during which, in a zone of the image covering a set of pixels in the vicinity of the pixel, the existence or respectively the absence of motion of the object relative to a preceding image is detected.

Method and apparatus for reducing noise in a sequence of fluoroscopic images

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Versailles, France

Benjamin Didier Réne Wimille