Advanced Micro Devices Corporation

Ati Technologies Ulc

Benjamin D Bates

Samuel D Naffziger

Stephen C Ennis

Steven Frederick Liepe

Ashish Jain

Madhu Saravana Sibi Govindan

Ali Akbar Merrikh

Praveen K Dongara

Brian E Williams

A method includes controlling a power limit of a computing system based on a determined skin temperature of at least one location on an outer surface of a device housing the computing system. A processor includes a processing unit and a power management controller to control a power limit of the processing unit based on a determined skin temperature of at least one location on an outer surface of a device housing the processor.

Power management to change power limits based on device skin temperature

A system and method for efficient management of operating modes within an integrated circuit (IC) for optimal power and performance targets. A semiconductor chip includes one or more processing units each of which operates with respective operating parameters. One or more temperature sensors are included to measure a temperature of the one or more processing units during operation. When the measured temperature exceeds a threshold, a power manager on the chip determines a temperature headroom utilizing temperature values based on worst-case ambient temperature. When the measured temperature does not exceed the threshold, the power manager determines the temperature headroom utilizing at least one temperature value based on room ambient temperature. Following, the power manager adjusts the respective operating parameters based on at least the temperature headroom.

Hybrid system and method for determining performance levels based on thermal conditions within a processor

Techniques are disclosed relating to controlling power consumption of temperature sensors in integrated circuits. In one embodiment, an integrated circuit is disclosed that includes a temperature sensor that is configured to determine a temperature of the integrated circuit. The integrated circuit also includes a sensor controller that is configured to vary power consumption of the temperature sensor based, at least in part, on the determined temperature. In some embodiments, the integrated circuit may determine a sampling rate of the temperature sensor based, at least in part, on the determined temperature and a temperature threshold of the integrated circuit. The integrated circuit may then vary the power consumption of the temperature sensor by periodically disabling the temperature sensor based on the determined sampling rate. In some embodiments, the integrated circuit may also vary the power consumption of the temperature sensor based on the operating state of one or more processing cores in the integrated circuit.

Controlling operation of temperature sensors

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New Braunfels, TX, United States of America

Benjamin D Bates