Psiquantum Corp.

Xcerra Corporation

Benjamin Brown

Naomi Nickerson

David P McConnell

Hector Bombin Palomo

Niraj Rangwala

Peter Pei-Tak Ho

Howard Maassen

Howard Massenn

A method includes obtaining a plurality of entangled qubits, with high fault tolerance, represented by a lattice structure. The lattice structure includes a plurality of contiguous lattice cells. A first subset of the plurality of entangled qubits defines a first plane, and a second subset of the plurality of entangled qubits defines a second plane that is parallel to and offset from the first plane. The plurality of entangled qubits includes a defect qubit that is entangled with at least one face qubit on the first plane and at least one edge qubit on the second plane.

Methods and devices for fault tolerant quantum gates

A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configured to: provide a voltage signal having a plurality of voltages to the at least one device under test, monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, and determine if one or more of the plurality of monitored current values exceeds one or more of a plurality of current thresholds.

Testing system and method

A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configured to: provide a voltage signal having a plurality of voltages to the at least one device under test, and monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages. The plurality of monitored current values are stored.

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Palo Alto, CA, United States of America

Benjamin Brown