International Business Machines Corporation

Benjamin A Fox

Andrew Benson Maki

Trevor Joseph Timpane

Nathaniel James Gibbs

Axel Aguado Granados

Layne A Berge

Wesley David Martin

George Russell Zettles, Iv

William Paul Hovis

Thomas W Liang

Paul William Rudrud

John Edward Sheets, Ii

Mark Kenneth Hoffmeyer

Jamie Randall Kuesel

David W Siljenberg

David M Onsongo

Roger John Gravrok

David Lawrence Pease

Todd Arthur Cannon

William James Csongradi, Jr

Ryan James Schlichting

George Zettles

Embodiments herein discuss tuning a testing apparatus to better match the input response of a target system in which a cable will be used. For example, conductors in the cable may have a different skew depending on the system in which they are used. The testing apparatus may be tuned using frequency information regarding the type of signals that will be driven on the cable when installed in the target system. In one embodiment, the testing apparatus adjusts a testing cycle refresh rate for generating a testing signal which changes the frequency content of the testing signal. Using the adjusted testing cycle refresh rate results in the driver outputting a testing signal that better reflects the actual signals that will be transmitted on the cable in the target system.

Tuning a testing apparatus for measuring skew

A system includes a transmit equalizer to equalize a data stream using a set of transmit parameters to generate an input signal. The system further includes a communication channel to receive the input signal. The system further includes a receive equalizer to receive an output signal from the communication channel in response to the input signal and detect the data stream from the output signal using a set of receive parameters. The system additionally includes a controller to change the set of transmit parameters in response to a condition, where the transmit parameters, the receive parameters, and the condition are selected to both enable the receive equalizer to detect the data stream from the output signal and reduce the likelihood of an external circuit detecting the data stream from the output signal.

Data security using high speed serial equalization

The embodiments of the present disclosure identify a target chip from among multiple chips coupled to a shared bus and customize an optimization parameter for the particular chip. Stated differently, in a communication system where only one chip (or a subset of chips) on a shared bus is the intended target, the system can customize an optimization parameter for the specific location of the target chip on the bus. As new data is received that is intended for a different chip&#x2014;i.e., the target chip changes&#x2014;the system can dynamically change the parameter based on the location of the new target chip on the bus.

Adjusting an optimization parameter to customize a signal eye for a target chip on a shared bus

Embodiments herein discuss tuning a testing apparatus to better match the input response of a target system in which a cable will be used. For example, conductors in the cable may have a different skew depending on the system in which they are used. The testing apparatus may be tuned using frequency information regarding the type of signals that will be driven on the cable when installed in the target system. In one embodiment, the testing apparatus uses the frequency information to configure a programmable clock source that can be used to shape a reference clock and control a driver to match the signals in the target system. Using the clock source to modify the reference clock results in the driver outputting a testing signal that better reflects the actual signals that will be transmitted on the cable in the target system.

Method and apparatus for clocked data eye measurement at synchronous interfaces is provided. A receiver may generate first vector information corresponding to data received on at least one communication channel at the receiver. The receiver may generate second information regarding when the data was latched by a clock signal, the clock signal being received on a separate communication channel at the receiver. The first vector information may be combined with the second information to generate combined information, the combined information indicating a quality of latching the data.

Method and apparatus for clocked data eye measurement

An apparatus includes a memory array to generate a data eye diagram. The memory array includes a plurality of rows of memory cells. The memory cells include a first row corresponding to a first sampling circuit of a first plurality of sampling circuits. The first sampling circuit is configured to compare an input voltage signal to a first reference voltage. The memory cells also include a second row corresponding to a second sampling circuit of the first plurality of sampling circuits. The second sampling circuit is configured to compare the input voltage signal to a second reference voltage. Each memory cell of the memory array is an incremental multi-bit counter.

Memory array to generate a data eye diagram

Systems and methods to set a voltage value associated with a memory controller coupled to a memory device are disclosed. A particular method includes comparing test data of a test path to functional data of a functional path. The functional data may be generated based on device data received at a memory controller from a memory device. The test data may be affected by a voltage value applied to a resistor arrangement in electronic communication with the test path. The voltage value may be applied to the resistor arrangement based on the comparison.

Setting a reference voltage in a memory controller trained to a memory device

Systems and methods to set a voltage value associated with a communication bus that includes memory controller coupled to a memory device are disclosed. A particular method may include performing a first calibration operation associated with first data written from a memory controller to a memory device. A second calibration operation may be associated with second data read at the memory controller from the memory device. The operating parameter may be set based on a result of at least one of the first and the second calibration operations at the memory device or the memory controller.

Training a memory controller and a memory device using multiple read and write operations

A method, structure, system of aligning a substrate to a photomask. The method includes: directing incident light through a pattern of clear regions transparent to the incident light in an opaque-to-the-incident-light region of a photomask, through a lens and onto a photodiode formed in a substrate, the photodiodes electrically connected to a light emitting diode formed in the substrate, the light emitting diode emitting light of different wavelength than a wavelength of the incident lights; measuring an intensity of emitted light from light emitting diode; and adjusting alignment of the photomask to the substrate based on the measured intensity of emitted light.

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Rochester, MN, United States of America

Benjamin A Fox