Rosemount Aerospace Limited

Ben Ping-Tao Fok

Magdi A Essawy

Roger Alan Backman

Thomas Wingert

James Joseph Mctighe

Marvin Gary Onken

A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational voltage is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to provide a test voltage different than the operational voltage and monitor a test current generated in the resistive heating element while providing the test voltage. The control circuit is further configured to detect micro fractures in the resistive heating element based on the test current.

Probe heater remaining useful life determination

A system and method for an aircraft includes a probe, first and second current sensors, and a control circuit. The probe includes a heater that includes a resistive heating element routed through the probe, wherein an operational current is provided to the resistive heating element to provide heating for the probe. The first current sensor is configured to sense a first current through the resistive heating element, and the second current sensor is configured to sense a second current through the resistive heating element. The control circuit is configured to determine a leakage current based on the first and second currents and determine a remaining useful life the probe based on the leakage current over time.

A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe system. An operational voltage is provided to the resistive heating element to provide heating for the probe system. The control circuit is configured to provide the operational voltage and monitor a capacitance between the resistive heating element and a metallic sheath of the heater over time. The control circuit is further configured to determine a remaining useful life of the probe system based on the capacitance.

A probe system is configured to receive thermal images of the probe system from a thermal imager and includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational voltage is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to provide the operational voltage and receive the thermal images from the thermal imager. The control circuit is further configured to monitor the thermal images over time and determine a remaining useful life of the probe system based upon the thermal images over time.

A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational current is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to monitor the operational current over time and determine a half-life estimate of the resistive heating element based upon an exponential function of the operational current over time.

A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe system. An operational voltage is provided to the resistive heating element to provide heating for the probe system. The control circuit is configured to provide the operational voltage and monitor a circuit frequency based on an element capacitance between the resistive heating element and a metallic sheath of the heater over time. The control circuit is further configured to determine remaining useful life of the probe system based on the circuit frequency.

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Rosemount, MN, United States of America

Ben Ping-Tao Fok