Bruker Nano Gmbh

Other

Pittenger, Bede

Su, Chanmin

Silva, Paul

Hu, Shuiqing

Huang, Lin

Bede Pittenger

Sergey Osechinskiy

Anthonius Ruiter

Syed-Asif Syed-Amanulla

Chanmin Su

Shuiqing Hu

Lin Huang

Paul Silva

Changchun Liu

Benedikt Zeyen

Kumar Virwani

An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.

Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)

An atomic force microscope (AFM) and corresponding method to provide low force (sub-20 pN) AFM control and mechanical property measurement is provided. The preferred embodiments employ real-time false deflection correction/discrimination by adaptively modifying the drive ramp to accommodate to deflection artifacts.

Force measurement with real-time baseline determination

An apparatus and method of automatically determining an operating frequency of a scanning probe microscope such as an atomic force microscope (AFM) is shown. The operating frequency is not selected based on a peak of the amplitude response of the probe when swept over a range of frequencies; rather, the operating frequency is selected using only peak data corresponding to a TIDPS curve.

Method and apparatus of tuning a scanning probe microscope

Aspects of the invention are directed to piezoresponse force analysis of a material. A stimulus signal including a first frequency component is applied to a contact point on the material such that the stimulus signal actuates a portion of the material to experience a motion as a result of a piezoelectric effect. A resonant device is coupled to the contact point such that the resonant device experiences a resonant motion at the first frequency component in response to the motion of the material, the resonant motion having a greater displacement than a displacement of the motion of the material, and is substantially unaffected by mechanical properties of the material at the contact point. The resonant motion of the resonant device is detected and processed to produce a measurement representing the piezoresponse of the material at the contact point.

Preamplifying cantilever and applications thereof

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Santa Barbara, CA, United States of America

Bede Pittenger