Stichting Imec Nederland

Bas Boom

Jan Willem De Wit

Rahul Yadav

A device for dielectric material characterization of a test sample is provided. The device comprises a resonator block comprising a groove at at least one side of the resonator block, wherein the groove comprises at least a first inclined surface and a second inclined surface and is configured to contact the test sample via the first inclined surface and/or the second inclined surface. In this regard, the resonator block is configured to generate a rotational electric field coupled between the first inclined surface and the second inclined surface of the groove and further to propagate the rotational electric field partially or fully through the test sample in order to perform dielectric material characterization of the test sample.

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Maarssen, Netherlands

Bas Boom