U.S. Philips Corporation

General Electric Company

Teledyne Dalsa B.v.

Teledyne Digital Imaging, Inc.

Bartholomeus G M H Dillen

Douglas Albagli

Brian David Yanoff

William Andrew Hennessy

Biju Jacob

Rudolph M Snoeren

Jeffery Jon Shaw

Inge Peters

Antonius J C Bruijns

Willibrordus H F M Van Den Meijdenberg

Anton Van Arendonk

An x-ray detector comprises: a housing, including a cover removably fastened on a flange of a flanged base and forming a semi-hermetic seal therebetween, the flanged base including a bottom surface and the flange surrounding a perimeter of the bottom surface; and an x-ray imager positioned on the bottom surface, the x-ray imager including a scintillator and an image sensor, wherein the seal semi-hermetically encloses the x-ray imager in the housing, and is positioned nonadjacently to surfaces in contact with the x-ray imager. In this way, a simpler and less costly seal for a digital x-ray panel can be provide; furthermore, the seal is reusable and resealable, facilitating repair and refurbishment of the device.

Scintillator sealing for solid state x-ray detector

An image pick-up apparatus including an image sensor with a matrix of radiation-sensitive elements, notably a CCD image sensor, is provided with a control circuit for selecting gate electrodes as collecting gate electrodes or as isolating gate electrodes by application of an electric potential of suitable polarity. Groups of collecting gate electrodes are separated from one another by isolating gate electrodes. The surface area of such a group of collecting gate electrodes co-determines the modulation transfer function and hence the spatial resolution of the image sensor; this surface area, and hence the spatial resolution, can be adjusted by adjustment of the electric potentials. Notably the spatial resolution can be rendered dependent on the different modes of operation of the image pick-up apparatus, for example when the image pick-up apparatus forms part of an X-ray examination apparatus which is suitable for fluoroscopy as well as for making X-ray images. Furthermore, the spatial resolution can be adjusted so that it differs in different directions. In the case of an image pick-up apparatus including a plurality of image sensors, each of which picks up the same image, be it with a shift relative to one another, an image is composed from the images supplied by the various image sensors. Differentiation of the spatial resolutions of the images constituting the composite image enables a spatial resolution in the composite image to be achieved which is the same and higher in all directions.

Image pick-up apparatus

An X-ray examination apparatus comprises an X-ray detector (,) for deriving an optical image from an X-ray image. An image pick-up device (,) derives an image signal from the optical image. The image pick-up device (,) is provided with an image sensor (,) having a plurality of sensor elements. The effective surface area of the sensor elements differs for different optical spectral components of the optical image. The image pick-up device is provided with an adjusting system for selecting an optical spectral component. The image signal is derived from the selected optical spectral component.

X-ray examination apparatus with a high-resolution image sensor

An X-ray examination apparatus comprises an X-ray detector,for deriving an image signal and a measurement signal from an X-ray image. The X-ray examination apparatus also includes an exposure control,for adjusting the X-ray examination apparatus on the basis of the measurement signal. The X-ray detector is arranged in such a manner that the measurement signal relates mainly to relevant image information in the X-ray image. The X-ray detector is notably provided with a conversion unit,for deriving an optical image from the X-ray image. An image sensor with an image pick-up section derives electrical charges from the optical image. The image pick-up section notably derives a measurement component from the electrical charges wherefrom the measurement signal is derived and the image pick-up section also derives an image component from the electrical charges wherefrom the image signal is derived.

X-ray examination apparatus including exposure control

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Eindhoven, Netherlands

Bartholomeus G M H Dillen