Fei Comapny

Max-planck-gesellschaft Zur F&#xf6;rderung Der Wissenschaften E. V.

Other

Koninklijke Philips Corporation N.v.

Bart Buijsse

Hendrik Gezinus Tappel

Cornelis Sander Kooijman

Colin Sanford

Steven Berger

Mark Meuwese

Sander Richard Marie Stoks

Martinus Petrus Maria Bierhoff

Hugo Van Leeuwen

Ben Jacobus Marie Bormans

Koen Arnoldus Wilhelmus Driessen

Peter Christiaan Tiemeijer

Alexander Henstra

Theodorus Hubertus Josephus Bisschops

Radostin Stoyanov Danev

Maarten Kuijper

Bart Jozef Janssen

Faysal Boughorbel

Yuchen Deng

Johannes Antonius Hendricus W G Persoon

Stefano Vespucci

Kasim Sader

Pleun Dona

Tomás Vystavel

Robert Frans Maria Hendriks

Eric Gerardus Theodoor Bosch

Hendrik Nicolaas Slingerland

Pavel Stejskal

Ivan Lazic

Alan Frank De Jong

Petrus Hubertus Franciscus Trompenaars

Sorin Lazar

Marco Hugo Petrus Moers

Gijs Van Duinen

Johannes Antonius Hendricus Wilhelmus Gerardus Persoon

Marek Uncovský

Jaydeep Sanjay Belapure

Sjoerd Antonius Maria Mentink

Bas Hendriksen

Abhay Kotecha

Johannes Antonius Hendricus Wg Persoon

Mart Petrus Maria Bierhoff

Maria Van Wely-Dieleman

Bernardus Jacobus Marie Bormans

Michael Patrick Janus

Hans Raaijmakers

Pierre Bleuet

Colin August Sanford

Jaydeep Belapure

Michael Janus

Eric Bosch

Radostin Danev

Marco Moers

Linda Van Driel

Bernardus Bormans

Mark Theo Meuwese

Johannes Antonius Hendricus WG Persoon

Johannes AHWG Persoon

Johannes Antonius Hendricus Wilhelmus G Persoon

The crystal structure is determined based on one or more second electron diffraction patterns acquired at selected zone axes at which the strength of dynamical effect is strong. The zone axes are selected by ranking the accessible zone axes determined from multiple first electron diffraction patterns.

Methods and systems for determining the absolute structure of crystal

Method and system for generating a diffraction image comprises acquiring multiple frames from a direct-detection detector responsive to irradiating a sample with an electron beam. Multiple diffraction peaks in the multiple frames are identified. A first dose rate of at least one diffraction peak in the identified diffraction peaks is estimated in the counting mode. If the first dose rate is not greater than a threshold dose rate, a diffraction image including the diffraction peak is generated by counting electron detection events. Values of pixels belonging to the diffraction peak are determined with a first set of counting parameter values corresponding to a first coincidence area. Values of pixels not belonging to any of the multiple diffraction peaks are determined using a second, set of counting parameter values corresponding to a second, different, coincidence area.

Method and system for generating a diffraction image

Molecular structure of a crystal may be solved based on at least two diffraction tilt series acquired from a sample. The two diffraction tilt series include multiple diffraction patterns of at least one crystal of the sample acquired at different electron doses. In some examples, the two diffraction tilt series are acquired at different magnifications.

Method and system to determine crystal structure

Crystallographic information of crystalline sample can be determined from one or more three-dimensional diffraction pattern datasets generated based on diffraction patterns collected from multiple crystals. The crystals for diffraction pattern acquisition may be selected based on a sample image. At a location of each selected crystal, multiple diffraction patterns of the crystal are acquired at different angles of incidence by tilting the electron beam, wherein the sample is not rotated while the electron beam is directed at the selected crystal.

Methods and systems for acquiring three-dimensional electron diffraction data

Diffraction patterns of a sample at various tilt angles are acquired by irradiating a region of interest using a first charged particle beam. Sample images are acquired by irradiating the region of interest using a second charged particle beam. The first and second charged particle beams are formed by splitting charged particles generated by a charged particle source.

Methods and systems for acquiring 3D diffraction data

Methods for using a dual beam microscope system to simultaneously process a sample and image the processed portions of the sample, according to the present disclosure include the initial steps of emitting a plurality of electrons toward the sample, splitting the plurality of electrons into two electron beams, and then modifying the focal properties of at least one of the electron beams such that the two electron beams have different focal planes. Once the two beams have different focal planes, the first electron beam is focused such that it acts as a STEM beam. The STEM beam is then used to process a region of the sample to induce a physical change (e.g., perform milling, deposition, charge adjustment, phase change, etc.). The second electron beam is focused to act as a TEM beam to perform imaging of the region of the sample being processed.

Dual beam microscope system for imaging during sample processing

Methods and systems for implementing laser-based phase plate image contrast enhancement are disclosed herein. An example method at least includes forming at least one optical peak in a diffraction plane of an electron microscope, and directing an electron beam through the at least one optical peak at a first location, where the first location determines an amount of phase manipulation the optical peak imparts to an electron of the electron beam.

Laser-based phase plate image contrast manipulation

Techniques of using a Transmission Charged Particle Microscope for diffraction pattern detection are disclosed. An example method including irradiating at least a portion of a specimen with a charged particle beam, using an imaging system to collect charged particles that traverse the specimen during said irradiation, and to direct them onto a detector configured to operate in a particle counting mode, using said detector to record a diffraction pattern of said irradiated portion of the specimen, recording said diffraction pattern iteratively in a series of successive detection frames, and during recording of each frame, using a scanning assembly for causing relative motion of said diffraction pattern and said detector, so as to cause each local intensity maximum in said pattern to trace out a locus on said detector.

Diffraction pattern detection in a transmission charged particle microscope

Molecular structure may be determined based on structure factors solved from the diffraction pattern and the electron microscopy image of the sample. In particular, the amplitudes of the structure factors may be determined based on intensities of diffraction peaks in the multiple diffraction patterns. The phases of the structure factors may be determined based on electron microscopy images and the intensities of the diffraction peaks.

Method and system for determining molecular structure

An x-ray source for computer tomography uses several sub-sources. An electron beam impacts the several sub-sources to achieve a high x-ray flux with high resolution. The several sub-sources produce a composite image, which is deconvolved to disentangle the composite image and render a useful image. The configuration of the several sub-sources can be optimized for a given specimen structure.

X-ray imaging technique

A method of investigating a specimen using X-ray tomography, comprising (a) mounting the specimen to a specimen holder, (b) irradiating the specimen with a beam of X-rays along a first line of sight through the specimen, and (c) detecting a flux of X-rays transmitted through the specimen and forming a first image. Then (d) repeating the steps (b) and (c) for a series of different lines of sight through the specimen, thereby producing a corresponding series of images. The method further comprises (e) performing a mathematical reconstruction on said series of images, so as produce a tomogram of at least part of the specimen, wherein the specimen is disposed within a substantially cylindrical metallic shell with an associated cylindrical axis, the beam of X-rays is produced by directing a beam of charged particles onto a zone of said metallic shell, so as to produce a confined X-ray source at said zone, and the series of different lines of sight is achieved by rotating said shell about said cylindrical axis, thereby causing relative motion of said zone relative to the specimen.

Arrangement for X-Ray tomography

A freestanding thin film of nano-crystalline graphite is described, as well as a method of producing a freestanding thin film of nano-crystalline graphite including: The films can be used, for example, as phase plates in a Transmission Electron Microscope.

Method of producing a freestanding thin film of nano-crystalline graphite

A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively.

User interface for an electron microscope

Growing community of inventors

Eindhoven, Netherlands

Bart Buijsse