Spin Memory, Inc.

Barry Hoberman

Benjamin S Louie

Neal Berger

Daniel L Hillman

Lester Crudele

Mourad El Baraji

Mourad El-Baraji

Dynamic redundancy buffers for use with a device are disclosed. The dynamic redundancy buffers allow a memory array of the device to be operated with high write error rate (WER). A first level redundancy buffer (e1 buffer) is couple to the memory array. The e1 buffer may store data words that have failed verification or have not been verified. The e1 buffer may transfer data words to another dynamic redundancy buffer (e2 buffer). The e1 buffer may transfer data words that have failed to write to a memory array after a predetermined number of re-write attempts. The e1 buffer may also transfer data words upon power down.

Method of reading data from a memory device using multiple levels of dynamic redundancy registers

Dynamic redundancy registers for use with a device are disclosed. The dynamic redundancy registers allow a memory bank of the device to be operated with high write error rate (WER). A first level redundancy register (e1 register) is couple to the memory bank. The e1 register may store data words that have failed verification or have not been verified. The e1 register may transfer data words to another dynamic redundancy register (e2 register). The e1 register may transfer data words that have failed to write to a memory bank after a predetermined number of re-write attempts. The e1 register may also transfer data words upon power down.

Device with dynamic redundancy registers

Memory device using levels of dynamic redundancy registers for writing a data word that failed a write operation

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Fremont, CA, United States of America

Barry Hoberman