Accenture Global Services Gmbh

Accenture Global Solutions Limited

Bargav Jayaraman

Sanjay Podder

Neville Dubash

Anurag Dwarakanath

Aditya Priyadarshi

Anitha Chandran

Nisha Ramachandra

Bindu Madhav Tummalapalli

Parvathy Vijay Raghavan

Shalini Chaudhari

Bhanu Anand

Dipin Era

Subani Basha Nure

A device may obtain a document. The device may identify a skip value for the document. The skip value may relate to a quantity of words or a quantity of characters that are to be skipped in an n-gram. The device may determine one or more skip n-grams using the skip value for the document. A skip n-gram, of the one or more skip n-grams, may include a sequence of one or more words or one or more characters with a set of occurrences in the document. The sequence of one or more words or one or more characters may include a skip value quantity of words or characters within the sequence. The device may extract one or more terms from the document based on the one or more skip n-grams. The device may provide information identifying the one or more terms.

Automated term extraction

A device may receive information identifying a first set of instructions. The first set of instructions may identify an action to perform to test a first program. The device may identify a second set of instructions, related to testing a second program, that can be used in association with the first set of instructions. The first test may be similar to the second test. The device may identify multiple steps, of the first set of instructions, that can be combined to form a third set of instructions. The third set of instructions may be used to test the first program or a third program. The device may generate program code in a first programming language to perform the action. The first programming language may be different than a second programming language used to write the first set of instructions. The device may perform the action.

Test automation using multiple programming languages

A device may obtain a test script document. The device may process the test script document to perform term extraction using one or more term extraction techniques to identify a set of terms of the test script document. The one or more term extraction techniques may include a skip n-gram term extraction technique. One or more terms, of the set of terms, may be located within an n-gram of the test script document. The device may process the test script document to perform hierarchy formation for results of performing term extraction. A relationship between a set of terms, of the set of terms, may be identified using hierarchy formation. The device may generate a functional diagram of the test script document based on the results of performing term extraction and results of performing hierarchy formation. The device may provide information identifying the functional diagram.

Automated functional diagram generation

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Hosur, India

Bargav Jayaraman