Qualcomm Incorporated

Baptiste Grave

Stefano Facchin

Mustafa Keskin

Bharani Chava

Keith Anthony O'Donoghue

David Jonathan Walshe

Roi Naor

Robert David Froggatt

An injection-locked oscillator includes a plurality of delay elements, two or more voltage control circuits, a phase comparator and a controller. The plurality of delay elements is connected in a loop and coupled to a global power supply. Each delay element has an input driven by a preceding stage and an output that drives a next stage. Each voltage control circuit couples one of the plurality of delay elements to the global power supply. The phase comparator is coupled to in-phase and quadrature outputs of the injection-locked oscillator. The controller is coupled to an output of the phase comparator and is configured to drive control inputs of the two or more voltage control circuits. The control input of each voltage control circuit determines a level of a voltage drop across the each voltage control circuit.

Random mismatch compensation for high frequency injection locking ring oscillators

An IC is provided. The IC includes a power grid including Mlayer interconnects extending in a first direction on an Mlayer and Mlayer interconnects extending in a second direction orthogonal to the first direction on an Mlayer, where x&#x3e;5. In addition, the IC includes a plurality of power switches. Further, the IC includes at least one sensing element located between the Mlayer and the Mlayer and configured to measure a voltage drop to devices powered by the plurality of power switches. The one or more of the plurality of power switches may be located below the power grid. The power switches of the plurality of power switches may be adjacent in the first direction and in the second direction to each sensing element of the at least one sensing element.

Granular sensing on an integrated circuit

A clock generation circuit has an injection-locked oscillator, a frequency doubler circuit, low pass filters and a calibration circuit. The injection-locked oscillator has an input coupled to a half-rate clock signal. The frequency doubler circuit has inputs coupled to outputs of the injection-locked oscillator. Each of the low pass filters has an input coupled to one of a plurality of outputs of the frequency doubler circuit. The calibration circuit includes comparison logic that receives outputs of the low pass filters. The calibration circuit has an output coupled to a control input of a source of a supply current in the injection-locked oscillator. In one example, the source of the supply current is a current digital to analog converter.

Phase calibration with half-rate clock for injection-locking oscillators

A method and an apparatus to provide bandgap calibration for multiple outputs are disclosed. In one implementation, a computing chip includes a bandgap current generator; a first adjustable current output coupled to the bandgap current generator; a second adjustable current output coupled to the bandgap current generator; a first switch selectively coupling the first adjustable current output to a calibration circuit and to a first analog-to-digital converter (ADC); and a second switch selectively coupling the second adjustable current output to a load on the computing chip and to the ADC.

Circuits and methods providing bandgap calibration for multiple outputs

A system includes a bandgap voltage generator coupled to a voltage supply and configured to produce a plurality of reference voltage levels in response to a plurality of calibration codes; an analog-to-digital converter (ADC) coupled to a reference voltage output of the bandgap voltage generator; a logic circuit coupled to an output of the ADC; a first memory element coupled to the logic circuit and configured to store a calibration coefficient indicative of a relationship of the calibration codes and the reference voltage levels; and a second memory element coupled to the logic circuit and configured to store a value of a first reference voltage level for the reference voltage output, wherein the logic circuit is configured to generate a first calibration code from the value of the first reference voltage level and the calibration coefficient.

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Douglas, Ireland

Baptiste Grave