Hinds Instruments, Inc.

Other

Baoliang Wang

John Freudenthal

Theodore C Oakberg

Paul Kadlec

Andy Leadbetter

James C Mansfield

Douglas C Mark

Christopher O Griffiths

Artemiy Mikheyev

Robert Lakanen

Andrew O Breninger

An apparatus includes a photoelastic modulator (PEM) optical element including a first driving axis and a second driving axis arranged at a selected angle with respect to each other and perpendicular to an optical axis, wherein the first driving axis and the second driving axis extend respective predetermined non-equal lengths that correspond to respective predetermined non-equal natural first and second PEM frequencies fand f. Methods of manufacture and operation are also disclosed.

Dual transducer photoelastic modulator

Example embodiments of methods, apparatus, and systems for measuring polarimetric parameters using spectroscopy are disclosed herein. Particular embodiments concern circular dichroism (CD) spectrometers that use a vertically aligned beam. In such embodiments, the solution being analyzed may have a top surface that forms a convex or concave meniscus, creating a surface through which the measuring beam passes that may refract the beam in undesirable ways. Accordingly, particular embodiments of the disclosed technology include one or more meniscus-compensating (meniscus-effect-reducing) components or subsystems. These components and/or subsystems can be used alone or in combination with one another to reduce the undesirable refractive effects caused by the meniscus at the solution's surface, thereby improving the resulting quality of the spectroscopy measurement and potentially improving the speed with which CD spectroscopy can be performed.

Mitigating meniscus effects in vertically oriented circular dichroism spectrometery

This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one aspect, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. The spatially resolved imaging approach described here is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

Polarization properties imaging systems

This invention is directed to methods of unambiguously measuring the absolute retardance, &#x3b4;of an optical sample. A method for measuring absolute retardance of an optical sample includes directing light comprising a plurality of wavelengths through a polarization state generator source, the optical sample, and a polarization state analyzer, detecting, at an imaging device, retardance measurement light emanating from the optical sample after also passing through the polarization state analyzer at the plurality of wavelengths, determining a measurement retardance associated with the detected retardance measurement light at each of the wavelengths, and determining an absolute retardance associated with the optical sample based on the measurement retardances determined at each of the wavelengths.

Unambiguous retardance measurement

This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one example, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. An example spatially resolved imaging approach described herein is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

A birefringence measurement system includes a lens mounted for selective movement into and out of use in the optical setup so that a wide range of sample types can be handled by the system without reconfiguring the primary components of the optical setup of the system (moving the detector, changing the light source power, etc.) in a manner that would sacrifice the cost effectiveness, efficiency, mechanical reliability and repeatability of measurements for such systems.

Birefringence measurement of polycrystalline silicon samples or the like

A system for measuring linear or circular diattenuation in an optical element includes a sample rotation stage for securing an optical element sample; a light source module for generating a source light beam and a detector module. The light source module and detector module are arranged with the sample rotation stage between them, thereby permitting the source light beam to propagate through a sample that may be secured in the sample stage and to the detector module. Linear motion control of the light source module and the detector module, as well as tilt control of the light source module, the sample rotation stage and the detector module is provided, thereby to facilitate detection, by the detector module of the modulated light intensity information corresponding to a diattenuation characteristic of the optical sample secured in the sample stage.

Measurement of linear and circular diattenuation in optical elements

A method of controlling a light beam in an optical system includes a light source that directs a collimated light beam along a path, through a sample, and toward the active area of a stationary detector. The method includes the step selectively moving a lens into the path of the light beam for spreading the beam in instances where the path of the beam is altered by the sample between the source and the stationary detector. The detector, therefore, is held stationary. Adjustment means are provided for increasing the intensity characteristic of the light that reaches the detector to account for a decrease in intensity that occurs when the lens is in the path of the light beam to spread the beam.

Detection method for birefringence measurement

Improving the throughput of systems for measuring birefringence of optical samples includes techniques for directing multiple beams through the photoelastic modulator component of the system so that, along with expanded detection mechanisms to accommodate the multiple beams, the heretofore scanning (via a single beam) of a line across the sample is considerably enlarged so that several lines covering a 'swath' of the sample area is scanned by the system of the present invention.

High throughput birefringence measurement

A support system for a vibrating component of an optical assembly that is adjacent to a frame, wherein the component is driven to vibrate along an X-direction of a three-dimensional Cartesian coordinate system. The support system includes a support member connected to the frame. The support system has contact elements that are adjustable for movement into and out of contact with the vibrating component to constrain motion of the vibrating component in the Y-direction and in the Z-direction, without constraining motion of the vibrating component in the X-direction.

Support system for vibrating optical assembly

A system for controlling a light beam in an optical setup includes a light source that directs a collimated light beam along a path, through a sample, and toward the active area of a stationary detector. A lens is selectively movable into the path of the light beam for spreading the beam in instances where the path of the beam is altered by the sample between the source and the stationary detector. The detector, therefore, is held stationary. Adjustment mechanisms are provided for increasing the intensity characteristic of the light that reaches the detector to account for a decrease in intensity that occurs when the lens is in the path of the light beam to spread the beam.

Detection system for birefringence measurement

A method of controlling a light beam in an optical system includes a light source that directs a collimated light beam along a path, through a sample, and toward the active area of a stationary detector. The method includes the step selectively moving a lens into the path of the light beam for spreading the beam in instances where the path of the beam is altered by the sample between the source and the stationary detector The detector, therefore, is held stationary. Adjustment means are provided for increasing the intensity characteristic of the light that reaches the detector to account for a decrease in intensity that occurs when the lens is in the path of the light beam to spread the beam.

A LED illuminating device includes an illuminating unit and a shell having a top side and chamber. The illuminating unit includes a PCB supported by the shell and one or more LED modules electrically and spacedly mounted on the PCB disposed in the chamber. Each of the LED modules includes a red LED, a blue LED and a green LED which are symmetrically arranged in a triangular manner side by side. The wires are emerged from two ends of the shell in a horizontal plane parallel to an adhesive layer so as to adapt for electrically linking two neighboring LED modules with each other in a flat plane manner. Finally, it reduces unnecessary length of the wire and minimizes the size of the device by decreasing the overall volume.

LED illuminating device

An outer case of a LED module includes a top case and a bottom case to receive the LED module therebetween. The top case has a plurality of through holes and a plurality of blocks spacedly protruding from an inner side of the top case. The bottom case has a plurality of corresponding clip holes spacedly formed thereat, wherein the blocks are detachably engaged with the clip holes respectively to detachably couple the top case with the bottom case so as to form a cavity therebetween for receiving the LED module at a position that portions of LEDs are protruded through the through holes respectively. Two wire holes are formed at two sides of the top case when the top case is coupled with the bottom case for guiding wires of the LED module extending out of the cavity through the wire holes respectively.

Outer case of LED module

The amount of gain applied to a photodetector such as a photomultiplier tube (PMT) is limited to an amount that does not cause the applied PMT bias voltage to overdrive, hence damage, the PMT. Techniques for limiting the PMT gain are implemented in a way that does not interfere with the precision with which the PMT gain may be established (by selection of a reference level) below that limited level.

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Beaverton, OR, United States of America

Baoliang Wang