Synopsys (shanghai) Co., Ltd.

Synopsys, Inc.

Bang Liu

Bohai Liu

Gary K Yeap

Ben Mathew

Hung-Chun Chien

Xiao-Ming Xiong

Padmashree Takkars

Kunfeng Ge

Chang-Wei Tai

Provided are methods and devices of organizing scan chains in an integrated circuit. One method comprises generating first preference information representing prioritized listing of a plurality of scanning elements for each of a plurality of scan chains based on a first criterion, generating second preference information representing prioritized listing of the plurality of scan chains for each of the plurality of scanning elements based on a second criterion and at a computing device, assigning each of the plurality of the scanning elements to one of the plurality of the scan chains based on the first preference information and the second preference information.

Method and device for reconstructing scan chains based on bidirectional preference selection in physical design

Reconstruction methods and devices are disclosed for scan chains in physical design that is based on two-way priority selection. The structural reconstruction method in the scan chains, in the first place, establishes a first preference sequence for a certain number of scanning elements in each of these scan chains as well as a secondary preference sequence for these scan chains in each of these scanning elements respectively. Then, two-way selection is executed between the scan chains and scanning elements based on the corresponding first preference sequence and secondary preference sequence, so that these scanning elements can be redistributed to these scan chains. The structural reconstruction method and device in the invention conduct an integrated optimization for a global scan chain, where the global wiring length is shortened dramatically and the wiring efficiency is improved.

Method and device for reconstructing scan chain based on bidirectional preference selection in physical design

Reconfiguration methods and devices are disclosed for scan chains with the planned unit taken into consideration, the one method comprising a first phase reconfiguration and second phase reconfiguration. The first phase reconfiguration first classifies a number of scan chains, wherein scan chains with the starting point and the ending point in the same planned unit are classified as a first aggregation of scan chains; scan chains with the starting point and the ending point not in the same planned unit are classified as a second aggregation of scan chains; and scan chains with both the starting point and the ending point at the same top level are classified as a third aggregation of scan chains. In sequence the scan chains within the first aggregation are reconfigured, then the scan chains within the second aggregation are reconfigured, and finally the scan chains within the third aggregation are reconfigured.

Method and device for reordering scan chains considering plan groups

Full-chip scan data can be advantageously used during design planning to minimize top-level scan wires and scan feedthroughs. The scan cells can be reordered using a modified cost function to promote connecting all scan cells in one plan group before crossing to a scan cell in another plan group. The modified cost function can take into account penalty parameters. The penalty parameters can include at least one of: membership in a plan group or a top-level physical hierarchy, size of a plan group, FLOATING/ORDERED scan element in scan data, location of endpoints of an ORDERED list, location of endpoints of a macro, and membership in a plan group containing a STOP point. Scan data, at the block-level and at the top-level, can be automatically updated to reflect the plan groups and optimized scan chains.

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Shanghai, China

Bang Liu