Analog Devices,inc.

Baeton Charles Rigsbee

Scott Gregory Bardsley

Charles D Lane

John Jerome Kornblum

Ziwei Zheng

Methods and structures are provided to improve the transfer functions of analog-to-digital converter systems. They address the converter error function that corresponds to a converter's transfer function. In particular, they provide a corrector with a corrector transfer function that defines a corrector error function which substantially mirrors at least a portion of the converter error function. The corrector processes the converter's output digital signals to realize corrector digital signals which are then combined with the original output digital signals to obtain a system with a system error function that is significantly reduced from the original converter error function.

Correction methods and structures for analog-to-digital converter transfer functions

An improved pipelined analog to digital converter that facilitates calibration for non-linearity errors and a method for obtaining calibration values. The analog to digital converter has a calibration mode in which the output bits for stages in the pipeline can be coupled to output pins of the device. Device pins that are used in normal operating mode to output the most significant bits of the ADC output are used in calibration mode to make available output bits of a pipeline stage being calibrated. A calibration method takes advantage of the outputs of the stages being directly observable to compute calibration values. The output bits of a pipeline stage are monitored as the analog input to the ADC is increased. A change in these bits identifies a subrange boundary. Errors are measured for values immediately above and immediately below each subrange boundary and used to compute correction factors.

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High Point, NC, United States of America

Baeton Charles Rigsbee