Samsung Electronics Co., Ltd.

Baek Jin Lim

Junghwan Choi

Youngdon Choi

Seungjin Park

Doobock Lee

Youngchul Cho

Seunghoon Lee

Hojun Yoon

A nonvolatile memory device may include a variable sampler configured to process a data signal in an amplifier mode or a sampler mode in response to a control signal, a selection circuit configured to transmit the data signal output from the variable sampler to a flip-flop via a delay unit or to the flip-flop via a path that bypasses the delay unit in response to the control signal, a converter configured to amplify a data strobe signal, a clock distribution network configured to transmit the data strobe signal amplified by the converter to the variable sampler or delay the amplified data strobe signal for a predetermined time and transmit the amplified data strobe signal to the flip-flop in response to the control signal, and a path controller configured to generate the control signal according to an input/output mode.

Nonvolatile memory device providing input/output compatibility and method for setting compatibility thereof

There is provided a semiconductor device, which includes a calibration code generator circuit configured to generate a calibration code according to changes in external conditions, a first driver circuit configured to output a data signal with an impedance value controlled by the calibration code, an emphasis control circuit configured to generate an emphasis data signal using the data signal, and to change the calibration code according to an operating frequency to generate an emphasis code; and a second driver circuit configured to output the emphasis data signal with an impedance value controlled by the emphasis code.

Semiconductor device and method for preforming emphasis driving

A semiconductor device according to an embodiment includes a plurality of sampler circuits configured to receive a plurality of offset clock signals or a plurality of divided clock signals and to sample a data signal in response to each of a plurality of divided clock signals. A calibration circuit applies a first offset clock signal to a first sampler circuit, applies a second offset clock signal having an opposite phase to the first offset clock signal to a second sampler circuit, and generates a first offset adjustment signal for adjusting an offset of the first sampler circuit based on an output of the first sampler circuit that is output in response to the first offset clock signal.

Semiconductor device

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SUWON-SI, South Korea

Baek Jin Lim