Hitachi High-Tech Corporation

Ayumi Tomiyama

Katsuhiko Kimura

Yoshihiro Satou

A surface inspection device () according to the present invention comprises: a plate-shaped sample holding member () which can hold a sample (); a spindle motor () for rotating the sample holding member (); a turntable () which is fixed to the spindle motor () and rotated by the spindle motor (); a frame () to which the spindle motor () is fixed; a plurality of support members () each having one end fixed to the sample holding member () and the other end fixed to the turntable (), the support members supporting the sample holding member () such that the sample holding member is displaceable in a focus direction which is the height direction with respect to the turntable (); and a sample drive unit () which displaces the sample holding member () in the focus direction with respect to the turntable (). This surface inspection device () can accurately drive the sample () in the focus direction.

Growing community of inventors

Tokyo, Japan

Ayumi Tomiyama