Kabushiki Kaisha Toshiba

Hitachi-high-technologies Corporation

Ayana Yamamoto

Kazunori Imoto

Masayuki Okamoto

Kouta Nakata

Ryohei Orihara

Kazuyuki Hirao

Takahiro Takimoto

Shun Hirao

Takefumi Kakinuma

Yuichi Miyamura

According to one embodiment, system includes a determination unit, a first storage, a second storage, a search unit and a display. The determination unit determines a feature quantity of the process-targeted manufacturing data. The first storage stores cause-unidentified manufacturing data. The second storage stores cause-identified manufacturing data. The search unit searches, based on the feature quantity of the process-targeted manufacturing data, the first storage and the second storage for the cause-unidentified manufacturing data and the cause-identified manufacturing data that have a feature quantity similar to that of the process-targeted manufacturing data. The display displays the search result.

Similar-defect search/display system, apparatus and method

According to an embodiment, a material recommendation apparatus includes an extractor, a creator, a matcher and a recommender. The extractor extracts information about a substance as a candidate for a material for an industrial product, a property of the substance, and a report time of the property from an electronic document. The creator creates, for each substance, time series data in which the property is associated with the report time. The matcher matches the time series data with a pattern. The recommender recommends, as the material, a substance corresponding to time series data that matches the pattern.

Material recommendation apparatus

Proposed is a charged particle beam device including an arithmetic processing unit that generates an image of a sample, based on a detection signal that is detected based on irradiation to the sample with a charged particle beam emitted from a charged particle source. The arithmetic processing unit searches a second image as a search target image with use of a first image as a template, and when a region corresponding to the first image is not detected in the second image, the arithmetic processing unit searches a third image that represents a region larger than a region displayed in the second image, with use of a second template.

Charged particle beam device

Growing community of inventors

Tokyo, Japan

Ayana Yamamoto