Ngk Insulators, Inc.

Aya Miura

Kenichi Noda

Ryotaro Yoshimura

Takeshi Hagio

Masahiro Furukawa

Makoto Miyahara

Katsuya Shimizu

Nobuhiko Mori

Masaaki Kawai

Kei Tanaka

A zeolite membrane complex comprises: a support; and a zeolite membrane formed on the support. The membrane is of SAT-type zeolite, and in an X-ray diffraction pattern obtained by X-ray irradiation to the zeolite membrane, a peak intensity around 2&#x3b8;=13.9&#xb0; is 1.5 times or more a peak intensity around 2&#x3b8;=8.5&#xb0;.

Zeolite membrane complex and method of producing zeolite membrane complex

The monolithic separation membrane structure includes a monolithic base, an intermediate layer and a separation membrane. The monolithic base has a plurality of filtration cells extending from a first end face to a second end face. The intermediate layer is formed on an inner surface of the filtration cells. The separation membrane is formed on an inner surface of the intermediate layer. An inner diameter not including the intermediate layer and the separation membrane of the plurality of respective filtration cells is greater than or equal to 1.0 mm to less than or equal to 2.0 mm. A partition wall thickness not including the intermediate layer and the separation membrane of the shortest portion of two adjacent filtration cells of the plurality of filtration cells is greater than or equal to 0.05 mm to less than 0.2 mm. A thickness of the intermediate layer is greater than or equal to 20 &#x3bc;m to less than 100 &#x3bc;m.

Monolithic separation membrane structure and method of manufacturing the same

Seed crystals are crystals of zeolite to be attached onto a support in production of a zeolite membrane complex including the support and a zeolite membrane formed on the support. The specific surface area of the seed crystals is not smaller than 10 m/g and not larger than 150 m/g. The strength obtained from a crystal component at a diffraction angle 2&#x3b8; indicating a maximum peak in a range of diffraction angle 2&#x3b8; from 12&#xb0; to 25&#xb0; in an X-ray diffraction pattern obtained by emitting X-ray to the seed crystals is not less than once and not more than 30 times that obtained from an amorphous component. It is thereby possible to improve adherence of the seed crystals to the support.

Seed crystals, method of producing seed crystals, method of producing seed crystals attachment support, and method of producing zeolite membrane complex

A zeolite membrane complex includes a support and a zeolite membrane formed on the support. The zeolite membrane is of an SAT-type zeolite. Among particles on the surface of the zeolite membrane, particles that have aspect ratios higher than or equal to 1.2 and lower than or equal to 10 account for 85% or more of the area of the surface of the zeolite membrane. This improves the orientations of the particles and also reduces the interstices among the particles. As a result, the denseness of the zeolite membrane is improved. Accordingly, for example, high gas separation performance can be obtained when the zeolite membrane complex is used as a gas separation membrane.

A peak intensity of a (002) plane is greater than or equal to 0.5 times a peak intensity of a (100) plane in an X-ray diffraction pattern obtained by irradiation of X-rays to a membrane surface of the ERI membrane.

ERI-structure zeolite membrane and membrane structure

A silica membrane filterincludes an ultrafiltration membrane, which is disposed on a support bodyand which contains an elementas a primary component, and a silica membranewhich is disposed on the ultrafiltration membraneand which has an aryl group. The ultrafiltration membranehas a structure infiltrated by Si of the silica membrane, the atomic ratio A (=Si/M) of Si to the element M in a membrane-side region, which is a region corresponding to 25% of the ultrafiltration membranefrom the silica membrane, satisfies 0.01&#x2264;A&#x2264;0.5, and the ratio A/B of the atomic ratio A to the atomic ratio B (=Si/M) in a base-material-side region, which is a region corresponding to 25% from the support body, is within the range of 1.1 or more.

Silica membrane filter

A peak intensity of a (110) plane is greater than or equal to 2.5 times a peak intensity of a (004) plane in an X-ray diffraction pattern obtained by irradiation of X-rays to a membrane surface of the AFX membrane.

Zeolite membrane having AFX structure, membrane structure, and method for manufacturing membrane structure

A silica membrane filterincludes a porous substrateand a silica membraneformed on the porous substrate, the silica membranehaving an aryl group. The silica membranehas an atomic ratio Si/C, as determined by elemental analysis using energy-dispersive X-ray spectrometry (EDX), in the range of 0.2 to 15. The silica membranepreferably has a thickness in the range of 30 nm to 300 nm and an X/Y, a ratio of an absorption intensity X of a Si&#x2014;O&#x2014;Si bond to an absorption intensity Y based on the aryl group in a Fourier transform infrared absorption spectrum (FT-IR), in the range of 5.0 to 200.

Silica membrane and separation membrane filter

A method for manufacturing a silica membrane filter includes performing, at least once, a fired membrane forming operation having a membrane forming step of applying, to a porous substrate, a precursor sol which is a sol of a silicon alcoxide including a p-tolyl group to form a precursor sol membrane, a drying step of drying the precursor sol membrane formed in the porous substrate to form a dried membrane, and a firing step of firing the dried membrane formed in the porous substrate to form a fired membrane, thereby preparing the silica membrane filter including the porous substrate and a silica membrane which is the fired membrane formed in the porous substrate, and a ratio of a total mass of the silica membrane to a total mass of the dried membrane is 38 mass % or more and 85 mass % or less.

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Nagoya, Japan

Aya Miura