Rigaku Corporation

Aya Kuribayashi

Toru Mitsunaga

Yuji Tsuji

Toshiyuki Kato

Keiichi Morikawa

Akito Sasaki

Kunio Nishi

Akira Echizenya

Takao Ohara

Mari Ookawa

An X-ray analysis apparatus has information about a relationship between selection of a measurement type and a replacement work of optical parts and shows, on a screen of a display, graphical information about optical parts which should be changed, to make it easy for an operator to perform a preliminary work before measurement. When the operator selects one desired measurement type among a plurality of measurement types in a selection window, there is displayed on the display, depending on the selected measurement type, graphical information about necessary optical parts which should be newly installed and/or installed optical parts which should be removed. The operator looks at the operating instructions and then performs the replacement work. The graphical information may be: graphical indication of the installation locations of the optical parts; different pictorial expressions about the installation and the removal works; and graphical indication of the identification marks of the optical parts.

X-ray analysis apparatus

X-ray analysis device

Growing community of inventors

Akishima, Japan

Aya Kuribayashi