Intel Corporation

Avner Kornfeld

Gregory F Taylor

Jonathan P Douglas

Shai Rotem

Hung-Piao Ma

George L Geannopoulos

Tawfik Arabi

J Keith Hodgson

David E Duarte

Gregory M Iovino

Takao Oshita

James S Ayers

Efraim Rotem

Alon Naveh

Tsvika Kurts

Jose A Maiz

Balkaran Gill

Norbert Roland Seifert

Described is an analog to digital converter (ADC) which comprises: a sigma-delta modulator to receive an analog signal, the sigma-delta modulator operable to perform chopping to cancel common-mode noise; and one or more counters coupled to the sigma-delta modulator to generate a digital code representative of the analog signal.

Low power analog to digital converter

Described is a processor comprising: a plurality of radiation detectors; a first logic unit to receive outputs from the plurality of radiation detectors, the logic unit to generate an output according to the received outputs, the output of the first logic unit indicating whether the processor was exposed to incoming radiations; and a second logic unit to receive the output from the first logic unit, and to cause the processor to perform an action according to the output from the first logic unit.

High dose radiation detector

Systems and methods of managing power provide for applying a voltage from a voltage regulator to a component of a computing system and reducing the voltage based on a power saving parameter that is dedicated to the component. The reduction can be in conjunction with the entry of the component into a low power state such as a standby state or an off state, where the power saving parameter defines a voltage such as a minimum operating voltage or minimum sustainable voltage for the component, respectively. In one embodiment, the component is a central processing unit.

Controlling standby power of low power devices

Systems for testing a plurality of integrated circuits at a plurality of frequencies and voltages is disclosed. In one embodiment, a plurality of integrated circuits is tested at least once within a predetermined set of combinations of frequencies and voltages. If the integrated circuit fails testing within any combination of a frequency and voltage within the predetermined set, the integrated circuit is retested at a different predetermined set of combinations of frequencies and voltages. If the integrated circuit fails testing within any combination of a frequency and voltage within the different predetermined set, the integrated circuit is discarded.

Arrangements having IC voltage and thermal resistance designated on a per IC basis

Arrangements having integrated circuit (IC) voltage and thermal resistance designated on a per IC basis.

Testing arrangement to distribute integrated circuits

Growing community of inventors

Portland, OR, United States of America

Avner Kornfeld