Prosight Ltd.

Applied Materials, Inc.

Applied Materials Israel Limited

Avi Simon

Alexander Kadyshevitch

Meir Weksler

Amos Breskin

Rachel Chechik

Marco Cortesi

A method of analyzing a biopsy sample containing tissue extracted from a prostate gland of a subject comprises measuring zinc level and an epithelial glandular tissue concentration in the sample, determining the likelihood that the sample is cancerous based on at least the zinc level and the epithelial glandular tissue concentration in the sample, and generating an output indicative of the likelihood.

Method and system for analyzing prostate biopsy

A method of analyzing a plurality of biopsy cores extracted from a plurality of respective biopsy locations in a prostate is disclosed. The method comprises: measuring a level of a chemical element in each of the biopsy cores, and generating a chemical element map of at least a portion of the prostate based on the levels and the respective biopsy locations. In some embodiments, the method determines at least one additional biopsy location for a future biopsy in the prostate.

Method of guiding prostate biopsy location

A method for production testing includes receiving a wafer including a semiconductor substrate and a non-conducting layer formed over the substrate, following etching of contact openings through the non-conducting layer to the substrate, the contact openings including an array of the contact openings arranged in a predefined test pattern in a test area on the wafer. An electron beam is directed to irradiate the test area, a specimen current flowing through the substrate responsive to the electron beam is measured. The specimen current is analyzed so as to assess a dimension of the contact openings.

Monitoring of contact hole production

Apparatus for analysis of a thin film formed over an underlying layer on a surface of a sample, the thin film including first elements, while the underlying layer includes second elements. The apparatus includes an electron gun, which directs a beam of electrons to impinge on a point on the surface of the sample at which the thin film is formed. An electron detector receives Auger electrons emitted by the first and second elements responsive to the impinging beam of electrons, and to output a signal indicative of a distribution of energies of the emitted electrons. A controller receives the signal and analyzes the distribution of the energies so as to determine a composition of the first elements in the thin film and a thickness of the thin film.

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Rehovot, Israel

Avi Simon