Lehighton Electronics, Inc.

Other

Austin R Blew

Steven C Murphy

Alexander Eidukonis

Michael Bronko

Steve Bell

Nikolai Eberhardt

Jerome C Licini

William Zuidervliet

Danh Nguyen

Michael W Bronko

Mike Bronko

An apparatus for testing of electrical or physical properties of a material include a single coil sensor mounted adjacent to a sample of the material. Sheet conductance of a wide variety of materials may be measured using the single coil to determine if the material conforms to generally accepted standards for the use to which the material will be put. In some examples, the material is a semiconductor wafer or flat panel. In other examples, the material is the body tissue of a patient. A non-invasive technique using the apparatus is also disclosed for monitoring the health of patient tissue such as musculature, and/or to determine whether healthy circulation is present, by measuring the conductance of the patient tissue in response to a magnetic field applied by the single coil. The single coil may be hand held, or it may be movable using an automated positioning system under computer control.

Sheet conductance/resistance measurement system

An apparatus () for contactless measurement of sheet charge density and mobility includes a microwave source (), a circular waveguide () for transmitting microwave power to a sample (), such as a semiconductor wafer or panel for flat panel displays, at a measurement location, a first detector () for detecting the forward microwave power, a second detector () for detecting the microwave power reflected from the sample, and a third detector () for detecting the Hall effect power. An automatic positioning subsystem () is also provided for allowing automatic positioning of a wafer () within the test apparatus (). The positioning system () includes a first end effector () and a rotator-lifter (). The first end effector () can grasp a sheet element () and move it to a desired position within the test apparatus (), while the rotator lifter () provides incremental adjustment of a theta angle of the sheet element () to allow automated mapping of an entire sheet element without the need for manual adjustment of the position of the sheet element. A second end effector () can be mounted opposite the first end effector () and can be used to automatically position the sheet element () within a sheet resistance testing module () located at an opposite end of the apparatus ().

Device and handling system for measurement of mobility and sheet charge density

An apparatus for testing of electrical, mechanical, physical and/or chemical properties of material in sheet form includes a cassette for holding of sheets and sensors rigidly mounted relative to the cassette. The sensors may be mounted adjacent a test location exterior to the cassette. The cassette and the sensors may be so configured and positioned that a suitable end effector may move sheets of material between storage locations in the cassette and test locations adjacent the sensors. A method for testing sheet material includes the steps of placing the sheet material in a cassette, and conducting tests employing one or more sensors rigidly mounted with respect to the cassette. The method may include employing an end effector to remove the sheet from the cassette, to position the sheet stepwise in several positions relative to the sensors, and to replace the sheet in the cassette upon completion of testing. Materials to be tested include flat panels for computer screens and other applications and semiconductor wafers.

Method and apparatus for testing of sheet material

An apparatus for testing of electrical, mechanical, physical and/or chemical properties of material in sheet form includes sensors which may be positioned adjacent to a surface of material in sheet form located in a cassette and supports positioned to reduce sag of the material. A method for testing sheet material includes the steps of placing the sheet material in a cassette, and testing the sheet material while in the cassette. A cassette includes shelves having defined therein test heads for testing properties of material in sheet form. Shelves may have test heads or sensors mounted in a lower surface thereof, which test heads or sensors cooperate with test heads or sensors mounted in the upper surface of the next lower shelf. Shelves may include test points that have multiple sensors that cooperate, such as by inductive coupling, to test the material. A robot end effector is dimensioned to contact a lower surface of material in a cassette and has test sensors defined therein for testing of properties of the material. Materials to be tested include flat panels for computer screens and semiconductor wafers.

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Lehighton, PA, United States of America

Austin R Blew