Vg Systems Limited

Fei Comapny

Austin Penrose Day

Pavel Stejskal

Bryan Barnard

Christopher James Stephens

Zoran Pesic

Chris Stephens

Martin Petrek

A method of analyzing a sample imaged by electron backscatter diffraction. The method comprises identifying a plurality of Kikuchi bands in an electron backscatter diffraction image of a position on the sample. The method further comprises forming, for each identified Kikuchi band, a respective vector representation of said Kikuchi band based at least in part on an estimate of the position on the sample. A configuration of the sample is determined by identifying a particular set of expected vector representations from a plurality of sets of expected vector representations as matching the vector representations of the plurality of identified Kikuchi bands.

Methods and apparatus for electron backscatter diffraction sample characterisation

The invention relates to an image capture assembly and method for use in an electron backscatter diffraction (EBSD) system. An image capture assembly comprises a scintillation screen () including a predefined screen region (), an image sensor () comprising an array of photo sensors and a lens assembly (). The image capture assembly is configured to operate in at least a first configuration or a second configuration. In the first configuration the lens assembly () projects the predefined region () of the scintillation screen () onto the array and in the second configuration the lens assembly () projects the predefined region () of the scintillation screen () onto a sub-region () of the array. In each of the first and second configurations the field of view of the lens assembly () is the same.

Image capture assembly and method for electron back scatter diffraction

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Clearwell, United Kingdom

Austin Penrose Day