Intel Corporation

Altera Corporation

University of Massachusetts

Atul Maheshwari

Ankireddy Nalamalpu

Mahesh K Kumashikar

Md Altaf Hossain

Mahesh A Iyer

Dheeraj R Subbareddy

Yuet Li

Ram K Krishnamurthy

Steven Hsu

Mark A Anders

Anshuman Thakur

Alexander Andreev

Gregory F Taylor

Rahul Pal

Greg F Taylor

Kuan-Yueh Shen

David E Duarte

Arun Jangity

Dheemanth Nagaraj

Wayne Burleson

Sanu K Matthew

Paola Zepeda

Vishak Venkotroman

David Parkhouse

Ramya Yeluri

Ian Kuon

Rajesh Vivekanandham

Wayson Lowe

Parker J Rachel

Ban Wong

The present disclosure describes programmable logic that may be operated in a turbo processing mode to cause an ongoing operation to be completed faster than a scheduled completion time. With at least some of the remaining time to the scheduled completion time, power savings may be realized by operating the programmable logic into a deep sleep mode, where configuration memory associated with the programmable logic may be set to a suitable voltage level as to not cause data loss at lower or zero voltage levels but otherwise realize power savings relative to an amount of power consumed during average processing operations.

Workload-dependent integrated circuit operation based on power headroom

Systems or methods of the present disclosure may provide for determining a loadline for operation of a programmable logic fabric where the loadline is based at least in part on design configuration details for a design or a configuration rather for generic deployment of the programmable logic device. The loadline may be determined using software modeling for the design or configuration. Additionally or alternatively, the loadline may be determined using runtime testing and sensing of real-world parameters. This determination based on real-world parameters of a deployment of the configuration or design is based on a determination of a step load for the design or configuration.

Dynamic loadlines for programmable fabric devices

Systems or methods of the present disclosure may provide for gradually adjusting a frequency of a clock signal. When transitioning from a configuration mode to a user mode, a clock of an integrated circuit (e.g., a field-programmable gate array or FPGA) may quickly (e.g., instantaneously) switch from a low configuration mode frequency to a high user mode frequency. This rapid increase in clock frequency may cause an inrush current and corresponding current-resistance voltage (IR) drop. To reduce or avoid the inrush current and IR drop, a frequency of the clock may be gradually ramped up from the configuration mode frequency to the user mode frequency.

Controlled transition between configuration mode and user mode to reduce current-resistance voltage drop

Systems or methods described herein may relate to latch-independent clock gating techniques to enable or disable an internal clock of an integrated circuit device. A programmable logic device includes a clock gating circuit that receives a clock signal and is latch independent. The clock gating circuit includes gating signal circuitry that generates a gating signal based on the clock signal and an enable signal. The clock gating circuit also includes a logic gate that generates a control signal based on the gating signal. The clock gating circuit also includes gated clock generation circuitry that generates a gated clock signal based on the clock signal and the control signal.

Self-gating flops for dynamic power reduction

Systems or methods of the present disclosure may provide a programmable logic device including multiple logic array blocks each having multiple programmable elements. The multiple logic array blocks are arranged in multiple rows that are segmented into multiple segments. The programmable logic device also includes repair circuitry disposed between the multiple segments. The repair circuitry remaps logic within a first segment of the multiple segments when a first logic array block of the multiple logic array blocks has failed. Moreover, the first segment includes the first logic array block.

Segmented row repair for programmable logic devices

An integrated circuit includes first and second routing crossbars. The second routing crossbar includes first conductors routed in a first direction in a first conductive layer and second conductors routed in a second direction that is perpendicular to the first direction in a second conductive layer. A first subset of the first conductors is coupled to the first routing crossbar. The first subset of the first conductors is coupled to a second subset of the first conductors through a first subset of the second conductors that is coupled to the first and second subsets of the first conductors through first vias. The second subset of the first conductors is coupled to a second subset of the second conductors to through second vias. At least one of the first conductors is decoupled from another one of the first conductors by third vias.

Circuits and methods for routing crossbars with programmable vias

Systems or methods of the present disclosure may provide efficient power consumption for programmable logic devices based on reducing guardband voltages. A programmable logic device may include circuit monitors to mimic critical paths of an implemented circuit design and generate timing information based on the critical paths. A controller on the programmable logic device may adjust the voltage guardband based on the timing information.

Systems and methods to reduce voltage guardband

A semiconductor device may include a programmable fabric and a processor. The processor may utilize one or more extension architectures. At least one of these extension architectures may be used to integrate and/or embed the programmable fabric into the processor as part of the processor. Systems and methods for transitioning data between the programmable fabric and the processor associated with different clock domains is described.

Flexible instruction set architecture supporting varying frequencies

Systems or methods of the present disclosure may provide for operating a programmable fabric including multiple programmable elements organized into a number of power domains that utilize a common voltage within the respective power domains. A current sensor senses a current of the programmable fabric. When the sensed current has crossed a threshold, the programmable fabric changes the number of power domains.

Switch based on load current

Systems or methods of the present disclosure may provide efficient electric power consumption of programmable logic devices based on providing different voltage levels to different portions (e.g., voltage islands) of the programmable logic device. For example, the programmable logic device may include circuitry to provide different voltage levels to different voltage islands. The programmable logic device may implement and operate logic configurations with different operating parameters using different operating voltages for efficient electric power consumption.

Power management using voltage islands on programmable logic devices

The present disclosure is directed to 3-D stacked architecture for Programmable Fabrics and Central Processing Units (CPUs). The 3-D stacked orientation enables reconfigurability of the fabric, and allows the fabric to function using coarse-grained and fine-grained acceleration for offloading CPU processing. Additionally, the programmable fabric may be able to function to interface with multiple other compute chiplet components in the 3-D stacked orientation. This enables multiple compute components to communicate without the need for offloading the data communications between the compute chiplets.

Three-dimensional stacked programmable logic fabric and processor design architecture

Embodiments of the present disclosure are related to dynamically adjusting a timing and/or power model for a programmable logic device. In particular, the present disclosure is directed to adjusting a timing and/or power model of the programmable logic device that operates at a voltage level that is not other than a predefined voltage defined by a voltage library. A system of the present disclosure may interpolate between voltage levels defined by the voltage libraries to generate a new voltage library for the programmable logic device. A timing and/or power model may be generated for the programmable logic device based on the new voltage library and the programmable logic device may be analyzed using the timing and/or power model at the interpolated voltage. The timing and/or power model may be used to generate a bitstream that is used to program the integrated circuit.

Dynamically scalable timing and power models for programmable logic devices

Methods and systems to control an output frequency relative to a reference frequency. A frequency control system includes a dual-input bias generator to separately receive management and operational controls. The bias generator includes a first bias generator circuit to generate a bias control based on a difference between the management control and a bias feedback reference during a first mode of operation, a second bias generator circuit to generate the bias control based on a difference between the operational control and the bias feedback reference during a second mode of operation, and a bias feedback reference circuit to generate the bias feedback reference based on the bias control. The first mode may include a characterization and/or a start-up mode. The second mode may include an operational mode, such as a feedback-controlled mode.

Frequency control system with dual-input bias generator to separately receive management and operational controls

In one embodiment, an analog-to-digital conversion in an integrated circuit is evaluated by an on-die testing circuit. For example, the on-die test circuitcan characterize one or both of the linearity and monotonicity of the digital-to-analog conversion. The value of a conversion output for a digital input code may be compared to the value of a prior conversion output of a prior step to provide digital difference values for each step of a sweep of digital input codes. Digital difference values may be compared to one or more predetermined limits to provide one or more pass/fail tests on-board the die. Other embodiments are described and claimed.

On-die digital-to-analog conversion testing

An analog-to-digital converter (ADC) suitable for measuring on-die DC or low frequency analog voltages may include a ring oscillator having a group of circuit cells successively and circularly coupled. Under certain circumstances, the ring oscillator may produce an output frequency that corresponds substantially linear to the input voltage. Other embodiments may be disclosed or claimed.

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Portland, OR, United States of America

Atul Maheshwari