Stmicroelectronics International N.v.

Atul Dwivedi

Kallol Chatterjee

Pijush Kanti Panja

Saiyid Mohammad Irshad Rizvi

Paras Garg

A method for determining temperature of a chip, includes generating a first voltage and a second voltage using a pair of bipolar-junction transistors, and generating a third voltage using another bipolar-junction transistor. When a most recent bit of a bitstream is a logic-zero, the difference between the first and second voltages is sampled using a switched-capacitor input-sampling circuit, and a difference between the first and second voltages is integrated, to produce a proportional-to-absolute-temperature voltage. The proportional-to-absolute-temperature voltage is quantized to produce a next bit of the bitstream. When the most recent bit of the bitstream is a logic-one, the third voltage is sampled using the switched-capacitor input-sampling circuit, and the third voltage is integrated, to produce a complementary-to-absolute-temperature voltage. The complementary-to-absolute-temperature voltage is quantized to produce a next bit of the bitstream. The bitstream is filtered and decimated to produce an output code representative of the temperature of the chip.

Method for implementing Vptat multiplier in high accuracy thermal sensor

Circuitry generates base-to-emitter voltages (Vbe, Vbe) of two BJTs biased at different current densities, a base-to-emitter voltage (Vbe) of a BJT biased so Vbe is complementary to absolute temperature and has a curved non-linearity across temperature, and base-to-emitter voltages (Vbe_c, Vbe_c) of two BJTs biased by a temperature independent constant current and a current proportional to absolute temperature so Vbe_c−Vbe_c has the same but opposite curved non-linearity across temperature as Vbe. A sampling circuit samples these voltages and provides them to inputs of a loop filter. Filter outputs are quantized to produce a bitstream. The sampling circuit: when the received bit of the bitstream is zero, causes integration of Vbe−Vbeto produce a voltage proportional to absolute temperature (αΔVbe); and when the received bit of the bitstream is one, causes integration of Vbe_c−Vbe_Vbe_c to produce a negative voltage complementary to absolute temperature −Vbe_c without non-linearity across temperature.

Controlled curvature correction in high accuracy thermal sensor

A temperature sensing circuit a switched capacitor circuit selectively samples ΔVbe and Vbe voltages and provides the sampled voltages to inputs of an integrator. A quantization circuit quantizes outputs of the integrator to produce a bitstream. When a most recent bit of the bitstream is a logic zero, operation includes sampling and integration of ΔVbe a first given number of times to produce a voltage proportional to absolute temperature. When the most recent bit of the bitstream is a logic one, operation includes cause sampling and integration of Vbe a second given number of times to produce a voltage complementary to absolute temperature. A low pass filter and decimator filters and decimates the bitstream produced by the quantization circuit to produce a signal indicative of a temperature of a chip into which the temperature sensing circuit is placed.

One or more embodiments are directed to inter-integrated circuit (I2C) transmitters, receivers, and devices that utilize a stable reference voltage for driving a pre-driver of the transmitter and for driving a first input stage of the receiver. One embodiment is directed to a device A device that includes an inter-integrated circuit (I2C) transmitter and an I2C receiver. The I2C transmitter includes a driver coupled to an I2C data line, and a pre-driver coupled to a variable first supply voltage, a second supply voltage, and a reference voltage. The pre-driver is configured to output a control signal to a control terminal of the driver. The I2C receiver includes a first stage coupled to the I2C data line, the variable first supply voltage, the second supply voltage, and the reference voltage.

High performance I2C transmitter and bus supply independent receiver, supporting large supply voltage variations

A low-voltage-differential-signaling (LVDS) fault detector includes first and second LVDS lines, and a window comparator provides a first output indicating whether a difference between voltages at the first and second LVDS lines is greater than a threshold voltage, and a second output indicating whether a difference between the voltages at the second and first LVDS lines is greater than the threshold voltage. A charge circuit charges a capacitive node when either the first or second output is at a logic low, and discharges the capacitive node when neither the first nor second output is at a logic low. A Schmitt trigger generates a fault flag if charge on the capacitive node falls to a threshold.

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Benares, India

Atul Dwivedi