Semiconductor Energy Laboratory Co., Ltd.

Atsuya Tokinosu

Hiromichi Godo

Satoru Okamoto

Tatsuya Okano

Takuro Kanemura

Ryo Nakazato

Taisuke Higashi

Hiroya Hibino

A learning data generation device that can generate learning data suitable for learning of an identification model. The learning data generation device has a function of cutting out part of first image data as second image data, a function of generating a two-dimensional graphic corresponding to the area of the second image data and representing a pseudo defect, a function of generating third image data by combining the second image data and the two-dimensional graphic, and a function of assigning a label corresponding to the two-dimensional graphic to the third image data. By using the third image data for learning of the identification model, a highly accurate identification model can be generated.

Learning data generation device and defect identification system

A data processing system, a data processing device, and a data processing method are provided. The data processing system includes a wearable device including a display means and an imaging means and a database that is connected to the wearable device through a network. The database includes at least one of pieces of information on a cooking recipe, a cooking method, and a material. The wearable device detects a first material by the imaging means. The wearable device collects information on the first material from the database. When the first material exists in a specific region in an imaging range of the imaging means, the information on the first material is displayed on the display means. When the first material does not exist in the specific region, the information on the first material is not displayed on the display means.

Data processing system and data processing method

Growing community of inventors

Kanagawa, Japan

Atsuya Tokinosu