Hitachi, Ltd.

Jvc Kenwood Corporation

Robert Boschgmbh

Nippon Oil Fats Co., Ltd.

Atsushi Yoshida

Shunji Maeda

Minoru Yoshida

Yukihiro Shibata

Kenji Oka

Kazuo Yamaguchi

Yuji Takagi

Chie Shishido

Toshihiko Nakata

Sachio Uto

Hiroaki Shishido

Kenji Watanabe

Takafumi Okabe

Hideki Aiba

Toshio Asano

Mitsunobu Isobe

Kazuo Majima

Jun Mochizuki

Shingo Okamoto

Daisuke Katsuta

Maki Koizumi

Maki Takami

Teruo Matsuo

Kinuyo Hagimae

Masao Taniguchi

Hisashi Mizumoto

Masao Kiryu

Katsunori Koike

Examples herein include a brake hydraulic pressure control apparatus including a base body formed with a channel of a brake fluid, a motor assembly having a rotor and a stator accommodated in a motor housing, and a control board of a controller that controls the motor assembly. The control board is arranged on a rotation axis of the rotor. A permanent magnet is attached to the motor assembly and rotates with the rotor, and a coil is wound around the stator. A feeding terminal is connected to the coil and the control board, and is used when being supplied with electric power from the control board. A positioning mechanism extends between and contacts the motor assembly and the control board to position the motor assembly and the control board. A detection sensor is mounted on the control board and detects a magnetic field generated by the permanent magnet.

Brake hydraulic pressure control apparatus

A phase information generator generates phase information indicating a phase an interpolation-frame. An extracted pixel determination unit generates first and second motion vector crossing pixels at which the motion vector detected for generating an interpolation-pixel intersects with the first and second frames, and determines extracted pixels based on the motion vector crossing pixels. An interpolation-phase selector selects an interpolation phase based on the phase information and whether or not the first and second motion vector crossing pixels are out of an effective pixel range. An interpolation-pixel generator generates the interpolation-pixel based on the first and second extracted pixels and the interpolation phase.

Interpolation-frame generation device and method

A motion vector detector detects a motion vector, and generates reliability data of the motion vector. Pixel selectors select pixels for dynamic interpolation and pixels for static interpolation. The mixing ratio generator generates a first mixing ratio of interpolation pixels of the dynamic interpolation and interpolation pixels of the static interpolation based on the reliability data. A mixing ratio generator generates a second mixing ratio based on a difference value between the pixels for the dynamic interpolation. A mixing ratio adjuster adjusts the mixing ratio so that the mixing ratio of the interpolation pixels of the static interpolation becomes larger to generate a third mixing ratio. An interpolation data generator mixes the interpolation pixels of the dynamic interpolation and the static interpolation with each other in response to the third mixing ratio.

Interpolation frame generation device

A black stripe detector is configured to detect a black stripe region of an input video signal in which a part of an effective region is a black stripe region, and to generate black stripe information. A keystone correction processor is configured to implement keystone correction processing for the input video signal, and to generate a keystone-corrected video signal. A black stripe information corrector is configured to correct the black stripe information which indicates a corrected black stripe region owned by the keystone correction video signal, to corrected black stripe information based on keystone correction parameters when the keystone correction processor performs keystone correction processing for the input video signal. A video signal processor is configured to implement predetermined video signal processing for the keystone-corrected video signal by using the keystone-corrected video signal and the corrected black stripe information.

Video signal processing device and projection-type display device

A black stripe detector is configured to detect whether or not each pixel of an input video signal is a pixel in a black stripe region, and to generate a black stripe identification signal. A signal combiner is configured to combine the input video signal and the black stripe identification signal with each other to generate a combination signal. A keystone correction processor is configured to implement keystone correction processing for the combination signal, and to generate a keystone-corrected video signal. A signal separator is configured to separate the keystone-corrected combination signal into a keystone-corrected video signal and a keystone-corrected black stripe identification signal. A video signal processor is configured to implement predetermined video signal processing for the keystone-corrected video signal by using the keystone-corrected video signal and the keystone-corrected black stripe signal.

A three-dimensional image processor includes an aspect conversion discriminator, an aspect conversion parameter generator, a 2D/3D conversion parameter generator, a frame memory unit and a read address controller. The aspect conversion discriminator generates a signal indicating whether or not a read position of a video signal is to be modified. The aspect conversion parameter generator generates a parameter indicating an aspect ratio of an image based on the video signal. The 2D/3D conversion parameter generator generates shift amounts for generating a left-eye signal and a right-eye signal based on the video signal. The frame memory unit temporarily stores the video signal. The read address controller controls the read position of the video signal based on the parameter and the shift amounts when the signal received from the aspect conversion discriminator indicates that the read position is to be modified.

Three-dimensional image processor and three-dimensional image processing method

An image processing apparatus includes a frame memory, a motion vector detector, a screen edge detector and an interpolation frame generator. The frame memory frame-delays an input signal and outputs the input signal as a delayed input signal. The motion vector detector detects a motion vector between frames based on the input signal and the delayed input signal. The screen edge detector detects a pixel corresponding to a screen edge in the input signal. The interpolation frame generator generates an interpolation frame from the input signal and delayed input signal based on the motion vector and the pixel corresponding to the screen edge. The interpolation frame generator generates the interpolation frame using the pixel corresponding to the screen edge or the pixel inside relative to the pixel corresponding to the screen edge when the motion vector points a pixel outside relative to the pixel corresponding to the screen edge.

Image processing apparatus and interpolation frame generating method

A frequency distribution monitor unit partitions, into a plurality of classes, a size of a vertical component of a motion vector, and detects a frequency of the number of occurrences at which the vertical component occurs in each of the classes. In a case where the vertical component of the motion vector exceeds a predetermined threshold value in predetermined specific classes, the offset control unit creates offset signals which shift read addresses in the vertical direction in delay units. A selection control unit controls to shift, in the vertical direction, pixel data selected by delay selection units.

Video signal processing apparatus and method

Arrangements for inspecting a specimen on which plural patterns are formed; capturing a first image of a first area; capturing a second image of a second area in which patterns which are essentially the same with the patterns formed in the first area; creating data relating to corresponding pixels of the first and second images, for each pixel; determining a threshold for each pixel for detecting defects directly in accordance with the first and second images; and detecting defects on the specimen by processing the first and second images by using the threshold for each pixel and information of a scattered diagram of brightness of the first and second images, wherein the threshold is determined by using information of brightness of a local region of at least one of the first and second images, with the local region including an aimed pixel and peripheral pixels of the aimed pixel.

Defect inspection method and apparatus

A method of inspecting patterns, including: adjusting a brightness of at least one of a first bright field image and a second bright field image detected from a specimen and directed to similar patterns on differing parts of the specimen, so as to more closely match a brightness; comparing the images which are adjusted in brightness to match with each other to detect dissimilarities indicative of a defect of the pattern, wherein in adjusting the brightness, the brightness between the first bright field image and the second bright field image is adjusted by performing a gradation conversion of at least one of the brightness between the first bright field image and the second bright field image; and wherein in the comparing, said defect of the pattern is detected by using information of a scattered diagram of brightness of the first bright field image and the second bright field image.

A method of inspecting patterns to detect a defect of the patterns by using information of a scattered diagram of brightness of said first and second images.

A defect inspecting apparatus includes a sample mounting device for mounting a sample; lighting and detecting apparatus for illuminating a patterned sample mounted on a mount and detecting the optical image of the reflected light obtained therefrom. Also included is a display for displaying the optical image detected by this lighting and detecting apparatus; an optical parameter setting device for setting and displaying optical parameters for the lighting and detecting apparatus on the display; and optical parameter adjusting apparatus for adjusting optical parameters set for the lighting and detecting apparatus according to the optical parameters set by the optical parameter setting apparatus; a storage device for storing comparative image data; and a defect detecting device for detecting defects from patterns formed on the sample by comparing the optical image detected by the optical image detecting apparatus with the comparative image data stored in the storage.

Method and apparatus for observing and inspecting defects

A method of inspecting defects of a plurality of patterns that are formed on a substrate to have naturally the same shape. According to this method, in order to detect very small defects of the patterns with high sensitivity without being affected by irregular brightness due to the thickness difference between the patterns formed on a semiconductor wafer, a first pattern being inspected is detected to produce a first image of the first pattern, the first image is stored, a second pattern being inspected is detected to produce a second image of said second pattern, the stored first image and the second image are matched in brightness, and the brightness-matched first and second images are compared with each other so that the patterns can be inspected.

A defect inspection apparatus for inspecting a fine circuit pattern with high resolution to detect a defective portion is constructed to have an objective lens for detecting an image of a sample, a laser illumination unit for illuminating the sample through the objective lens, a unit for reducing the coherence of the laser illumination, an accumulation type detector, and a unit for processing the detected image signal.

Defect inspection method and apparatus therefor

A defect inspecting apparatus can detect finer defects with high resolution optical images of those defects. The apparatus includes a sample mounting device for mounting a sample; lighting and detecting apparatus for illuminating a patterned sample mounted on a mount and detecting the optical image of the reflected light obtained therefrom. A display displays the optical image detected by this lighting and detecting apparatus. An optical parameter setting device sets and displays optical parameters for the lighting and detecting apparatus on the display. An optical parameter adjusting apparatus adjusts optical parameters set for the lighting and detecting apparatus according to the optical parameters set by the optical parameter setting apparatus. A storage device stores comparative image data. A defect detecting device detects defects from patterns formed on the sample by comparing the optical image detected by the optical image detecting apparatus with the comparative image data stored in the storage.

Growing community of inventors

Yokohama, Japan

Atsushi Yoshida