Olympus Corporation

Olympus Optical Company, Ltd.

Atsushi Yonetani

Yasushi Fujimoto

Kenichi Koyama

Atsuhiro Tsuchiya

Kazuhiro Hasegawa

Nobuyoshi Toyohara

Ken Kawamata

Yorio Wada

Yukio Nonoda

Takeshi Deguchi

Kunihiko Uzawa

Kazuhiko Yamanouchi

Kenji Kawasaki

Kenichiro Abe

Ryuichi Hirano

Kenichi Kusaka

Masayoshi Karasawa

Katsuyuki Abe

Tsuyoshi Mochizuki

Masato Kanao

Kazumi Ito

Sadashi Adachi

Gakuji Higuchi

An imaging optical system includes an objective, an image-formation optical system, and an image sensor, wherein an object, the objective, the image-formation optical system, and the image sensor are arranged in this order, the objective includes: a first lens group that includes a meniscus lens component that is the closest to an image among the first lens group, the meniscus lens component having a convex surface facing the object; and a second lens group that is closer to the image than the first lens group is, and the imaging optical system satisfies the following conditional expression:4&#xd7;10&#x2264;1&#xd7;10&#x2003;&#x2003;(1)

Imaging optical system and microscope system

An observation deviceincludes an imaging optical systemthat forms an image on the basis of light from sample S, an aperture diaphragmthat changes a numerical aperture on an emission side of the imaging optical system, a camerathat converts the image of the sample into image signals, the image of the sample being formed by the imaging optical system, an observation scope changing unit that performs an observation scope changing process in which an observation scope is changed to a specified scope by changing an extraction scope, the extraction scope being a scope from which the image signals obtained by the cameraare extracted, a monitorthat displays the image signals from the specified scope obtained through the observation scope changing process, and a control unit that controls the aperture diaphragmin accordance with the specified observation scope.

Observation device that controls numerical aperture in accordance with specified observation scope

In a microscope having a plurality of optical units each including a filter block between an objective and a tube lens, the optical unit closest to the objective among the plurality of optical units includes a first filter block provided with an optical filter having a first effective diameter. The optical unit closest to the tube lens among the plurality of optical units includes a second filter block provided with an optical filter having a second effective diameter larger than the first effective diameter.

Microscope provided with plural optical units

A culture microscope apparatus has an illumination unit to apply excitation light to the specimen, a specimen observing portion to observe light generated from the specimen due to the excitation light, and a dimmer unit to dim the excitation light that has penetrated the specimen.

Culture microscope apparatus

A microscope objective includes at least five lens components, which are divided into three groups that are, in order from an object side: a front group having a positive refracting power as a whole and having a meniscus lens component with an object-side surface thereof being concave toward the object side; a middle group having a positive refracting power as a whole and having a plurality of cemented lens components; and a rear group having a pair of concave air-contact surfaces arranged adjacent and opposite to one another, wherein the following conditions are satisfied: 3&#x2266;D/f&#x2266;6 and 1&#x2266;H/H&#x2266;1.5, where Dis an axial distance from an object surface to a rearmost surface of the microscope objective, f is a focal length of the microscope objective, His a height of a marginal ray as emergent from the rearmost surface of the microscope objective, and His a maximum height of the marginal ray as passing through the front group and the middle group.

Microscope objective

An image pickup apparatus has an image sensor recording image information; a dustproof glass for keeping hermeticity of the periphery of the image sensor, placed in front of the image sensor; an optical filter removably placed in front of the dustproof glass; and a camera mount placed in front of the optical filter. The image pickup apparatus further has a parfocal adjusting device in which a focal position where the optical filter is demounted can be adjusted so as to be nearly equal to the focal position where the optical filter is mounted.

Electronic imaging apparatus provided with a dustproof member

A microscope objective includes, in order from the object side, a first lens unit with positive refracting power, having two meniscus lenses, each with a concave surface facing the object side, and at least one positive lens; a second lens unit with positive refracting power; and a third lens unit having concave surfaces adjacent and opposite to each other configured as air contact surfaces. The microscope objective satisfies the following conditions:7&#x2266;f0.5&#x3c;NAwhere f is the focal length (mm) of the microscope objective and NA is the numerical aperture of the microscope objective on the entrance side.

A microscope objective lens is disclosed that includes, in order from the object side, a first lens group having positive refractive power, a second lens group having positive refractive power that is movable along the optical axis, and a third lens group. The first lens group includes, in order from the object side, two meniscus lens components, each with its concave surface on the object side, and at least one positive lens component, and the third lens group has adjacent concave lens element surfaces that face each other and are in contact with air. Specified conditions may be satisfied, and one or more lens components in the first lens group and the second lens group may be movable.

Microscope objective lens

An observation or measurement device has, at least, an infinity-corrected objective lens and an imaging lens, and satisfies a condition, 4.56&#x2266;D&#xb7;NA'&#x2266;30 (mm), where D is the parfocal distance of the objective lens and NA&#x2032; is the numerical aperture of the imaging lens. It is desirable to make a distance from the mount position of the objective lens to the most object-side surface of the imaging lens variable and to satisfy a condition, 0.5 FL&#x3c;W&#x3c;1.2 FL (mm), where W is the variable amount of the distance from the mount position of the objective lens to the most object-side surface of the imaging lens, and FL is the focal length of the imaging lens. It is more desirable to satisfy conditions, 0.4&#x3c;D/FL&#x3c;5 and 1&#x2266;D/&#x3c6;d&#x3c;3, where &#x3c6;d is the outside diameter of a connection at the mount of the objective lens.

Observation or measurement means and observation or measurement system provided with the same, feeble light image pickup optical system and microscope apparatus provided with the same, microscope system provided with the microscope apparatus, and observation apparatus and observation system provided with the same

An electronic imaging apparatus includes a connecting section connected to an optical apparatus; an optical element having a preset transmittance with respect to light in a preset wavelength region, incident from the optical apparatus; and an electronic image sensor receiving the light transmitted through the optical element.

Electronic imaging apparatus and microscope apparatus using the same

A microscope includes an optical element provided with an anti-reflection film applied thereto. The anti-reflection film has the following layered structure:

Anti-reflection film and microscope having optical element with the same anti-reflection film applied thereto

The relay optical system comprises, in order from the intermediate image position I toward the the exit pupil EXP side, a first unit Ghaving a negative refracting power and a second unit Ghaving a positive refracting power, wherein the distance from the rearmost surface of the second unit to the exit pupil position is at least 30 mm. The relay optical system allows a photographing apparatus to be mounted on a microscope without the microscope and the photographing apparatus excluding each other from their predetermined positions.

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Tama, Japan

Atsushi Yonetani